STM32F412RGT6PTR datasheet(122/201 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32F412xE/G

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DocID028087 Rev 7

6.3.15

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product

operation. However, in order to give an indication of the robustness of the microcontroller in

cases when abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into

the I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (>5

LSB TUE), out of conventional limits of induced leakage current on adjacent pins

(out of –5 µA/+0 µA range), or other functional failure (for example reset, oscillator

frequency deviation).

Negative induced leakage current is caused by negative injection and positive induced

leakage current by positive injection.

The test results are given in Table 56.

Note:

It is recommended to add a Schottky diode (pin to ground) to analog pins which may

potentially inject negative currents.

Table 56. I/O current injection susceptibility(1)

1. NA = not applicable

Symbol

Description

Functional susceptibility

Unit

Negative

injection

Positive

injection

IINJ

Injected current on BOOT0 pin

–0

Injected current on NRST pin

–0

Injected current on PB3, PB4, PB5, PB6,

PB7, PB8, PB9, PC13, PC14, PC15, PH1,

PDR_ON, PC0, PC1,PC2, PC3, PD1,

PD5, PD6, PD7, PE0, PE2, PE3, PE4,

PE5, PE6

–0

Injected current on any other FT pin

–5

Injected current on any other pins

–5

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