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MPXM2102AS Datasheet(PDF) 497 Page - Motorola, Inc |
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MPXM2102AS Datasheet(HTML) 497 Page - Motorola, Inc |
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497 / 670 page ![]() AN1556 3–351 Motorola Sensor Device Data www.motorola.com/semiconductors Maximum Temperature Effect on Offset = (Gain) • (TCVoff) • (Maxtemp – MinTemp) MAX. TEMPERATURE EFFECT ON OFFSET (POSITIVE TEMP. COEFF.) MAX. TEMPERATURE EFFECT ON OFFSET (NEGATIVE TEMP. COEFF.) REQUIRED HEADROOM Figure 6. The Maximum Temperature Effect on Offset 8. Calculate the Maximum Offset Variation. The Maximum Offset Variation is the total amount of the Required Headroom that must be reserved to account for the entire distribution of sensor offsets (at room temperature — refer to Figure 7). where largest offset is and the smallest offset is Maximum Offset Variation = [Gain] • [MaxSensOff – MinSensOff] [Gain] • [MaxSensOff] [Gain] • [MinSensOff] 9. Calculate the worst case Minimum Offset. The worst case Minimum Offset includes both temperature effects (from Step 7) and device–to–device variations (from Step 8) to determine the smallest possible offset over the entire distribution of sensor offsets and over the operating temperature range. This worst case Minimum Offset occurs when a sensor has a nominal room temperature offset of MinSensOff (smallest offset in the sensor offset distribution) and a negative temperature coefficient so that the offset decreases with increasing temperature. Refer to Figure 7. Minimum Offset = [Gain] • [MinSensOff] – Maximum Temperature Effect on Offset 10. Similar to Step 9, calculate the worst case Maximum Offset. The worst case Maximum Offset includes both temperature effects (from Step 7) and device–to–device variations (from Step 8) to determine the largest possible offset over the entire distribution of sensor offsets and over the operating temperature range. This worst case Maximum Offset occurs when a sensor has a nominal room temperature offset of MaxSensOff (largest offset in the sensor offset distribution) and a positive temperature coefficient so that the offset increases with increasing temperature. Refer to Figure 7. Maximum Offset = [Gain] • [MaxSensOff] + Maximum Temperature Effect on Offset MAXIMUM OFFSET MINIMUM OFFSET MAX. TEMPERATURE EFFECT ON OFFSET (POSITIVE TEMP. COEFF.) MAX. TEMPERATURE EFFECT ON OFFSET (NEGATIVE TEMP. COEFF.) REQUIRED HEADROOM MAX. OFFSET VARIATION (BEFORE ADDING TEMP. EFFECTS) Figure 7. Calculating the Maximum and Minimum Offsets 11. Calculate the Required Headroom. Referring to Figure 7, the Required Headroom is the difference between the Maximum Offset and Minimum Offset and is the amount of voltage range (bits of the A/D) required to allow for device–to–device and temperature variations of the sensor’s offset. Required Headroom = Maximum Offset – Minimum Offset 12. Compare the Required Headroom of Step 11 to the Calculated Headroom of Step 6. The Calculated Head- room is the absolute maximum amount of offset variation (due to device–to–device variations and temperature effects) that the system can allow for the desired resolution. If the Required Headroom is greater than the Calculated Headroom, the desired resolution is not attainable for all worst case variations due to temperature effects, component tolerances, and device–to–device variations. Therefore, the requirement to attain the desired system resolution is: Calculated Headroom ≥ Required Headroom If this requirement is not met, as stated previously, the alternatives to meeting this requirement are the following: • Relax the Resolution requirement and repeat the meth- odology. • Reduce (tighten) the span or offset (or both) variation and repeat the methodology. • Reduce temperature coefficients. • Reduce the component tolerances and repeat the methodology. • Repeat the methodology by performing a combination of the above suggestions. Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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