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MPXM2102AS Datasheet(PDF) 523 Page - Motorola, Inc |
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MPXM2102AS Datasheet(HTML) 523 Page - Motorola, Inc |
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523 / 670 page ![]() AN1636 3–377 Motorola Sensor Device Data www.motorola.com/semiconductors IMPROVEMENT ON OFFSET ERROR In the following calculations, we will illustrate how auto–zero will improve the offset error contribution. We will use the MPXV4006G interfaced to an 8–bit A/D as an example. When auto–zero is performed, the offset errors are reduced and the resulting offset errors are replaced with the error (due to resolution) of the A/D. We can categorize the offset error contributions into temperature and calibration errors. Temperature Coefficient of Offset Error The offset error due to temperature is due to Temperature Coefficient of Offset, or TCO. This parameter is the rate of change of the offset when the sensor is subject to temperature. It is defined as: TCO = ( ∆VOFF/∆T). The MPXV4006G has a temperature coefficient of offset (normalized with the span at 25 °C) of: ∆TCO = (∆VOFF/∆T)/VFS@25°C = 0.06% FS/°C. As an example, if the sensor is subjected to temperature range between 10 °C and 60°C, the error due to TCO is: ∆TCO = (0.06% FS/C)*(60°C * 10°C) = "3.0% FS. Offset Calibration Errors Even though the offset is laser trimmed, offset can shift due to packaging stresses, aging and external mechanical stresses due to mounting and orientation. This results in offset calibration error. For example, the MPXV4006G data sheet shows this as: VOFF MIN = 0.100 V, VOFF TYPICAL = 0.225 V and VOFF MAX = 0.430 V. We can then calculate the offset calibration error with respect to the full scale span as: ∆VOFF MIN,MAX = (VOFF TYPICAL *VOFF MIN,MAX)/VFS. This results in the following offset calibration error, ∆VOFF MIN = 2.7% FS and ∆VOFF MAX = 4.5% FS. A/D Error As mentioned above, we can reduce offset errors (calibration and TCO) when we perform auto–zero. These errors are replaced with the A/D error (due to its resolution), ∆OFFSETAUTOZERO = ∆TCO + ∆OFFSET = ∆A/D. Typically, a sensor is interfaced to an 8–bit A/D. With the A/D reference tied to VRH = 5 V and VRL = 0 V, the A/D can resolve 19.6 mV/bit. For example, the MXPV4006G has a sensitivity of 7.5 mV/mmH20, the resolution is therefore, A/DRESOLUTION = 19.6 mV/bit)/(7.5 mV/mmH20) = 2.6 mmH20/bit. Assuming +/ *1 LSB error, the error due to digitization and the resulting offset error is, ∆A/D = ∆OFFSETAUTOZERO = 2.6 mmH20/612 mmH20 =+/ * 0.4% FS. It can be seen that with increasing A/D resolution, offset errors can be further reduced. For example, with a 10–bit A/D, the resulting offset error contribution is only 0.1% FS when auto–zero is performed. If auto–zero is to be performed only once and offset correction data is stored in non–volatile memory, the TCO offset error and calibration error will not be corrected if the sensor later experiences a wide temperature range or later experience an offset shift. However, if auto–zero is performed at the operating temperature, TCO error will be compensated although subsequent offset calibration error will not be compensated. It is therefore best to auto–zero as often as possible in order to dynamically compensate the system for offset errors. CONCLUSION Auto–zero can be used to reduce offset errors in a sensor system. This technique can easily be implemented when an integrated pressure sensor is interfaced to an A/D and a microcontroller. With a few lines of code, the offset errors are effectively reduced; the resulting offset error reduction is limited only by the resolution of the A/D. Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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