Description

The Edge710 is a totally monolithic ATE pin electronics solution manufactured in a high-performance complementary bipolar process. In Automatic Test Equipment (ATE) applications, the Edge710 incorporates

a driver, a load, and a window comparator suitable for very fast bidirectional channels in VLSI, Mixed-Signal, and

Memory test systems.

Features

• Fully Integrated Three-Statable Driver, Window Comparator, and Dynamic Active Load

• 12V Driver, Load, Compare Range

• 13V Super Voltage Capable

• ±35 mA Programmable Load

• Comparator Input Tracking >6V/ns

• Leakage (L+D+C) < 1 µA (normal mode)

• Leakage (L+D+C) < 25 nA (IPD mode)

• Small footprint (52 pin MQFP)

Applications

• VLSI Test Equipment

• Mixed-Signal Test Equipment

• Memory Testers (Bidirectional Channels)

• ASIC Verifiers