FXPS7115D4 datasheet(6/72 Pages) NXP

6 / 72 page

NXP Semiconductors

FXPS7115D4

Digital absolute pressure sensor, 40 kPa to 115 kPa

FXPS7115D4

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Product data sheet

Rev. 3 — 5 December 2019

6 / 72

7.3.2 Self-test functions

The device includes analog and digital self-test functions to verify the functionality of the

transducer and the signal chain. The self-test functions are selected by writing to the

ST_CTRL[3:0] bits in the DSP_CFG_U1 register. The ST_CTRL bits select the desired

self-test connection.

Once the ENDINIT bit is set, the ST_CTRL bits are forced to '0000'. Future writes to the

ST_CTRL bits are disabled until a device reset.

7.3.2.1 PABS common mode verification

When the PABS common mode self-test is selected, the ST_ACTIVE bit is set, the

ST_ERROR is cleared, and the device begins an internal measurement of the common

mode signal of the P-cells and compares the result against a predetermined limit. If the

result exceeds the limit, the ST_ERROR bit is set. The PABS common mode self-test

repeats continuously every tST_INIT when the ST_CTRL bits are set to the specified value.

Once the test is disabled, the ST_ERROR bit updates with the final test result within

tST_INIT of disabling the test. The ST_ACTIVE bit remains set until the final test result is

reported. Figure 4 is an example of a user-controlled self-test procedure.

FXPS7115D4 Datasheet(PDF) 6 Page - NXP Semiconductors