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SPC58NH84C3 Datasheet(PDF) 29 Page - STMicroelectronics |
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SPC58NH84C3 Datasheet(HTML) 29 Page - STMicroelectronics |
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29 / 147 page ![]() DS12304 Rev 5 29/147 SPC58EHx, SPC58NHx Electrical characteristics 30 IDDSTBY8(12) CC D Total standby mode current on VDD_LV and VDD_HV supply, 8 KB RAM(13) TJ = 25 °C — 130 380 µA CTJ = 40 °C — — 550 DTJ = 55 °C — — 820 DTJ = 120 °C — 1.37 4 mA PTJ = 150 °C — 2.9 8 IDDSTBY128(12) CC D Total standby mode current on VDD_LV and VDD_HV supply, 128 KB RAM(13) TJ = 25 °C — 150 530 µA CTJ = 40 °C — — 790 µA DTJ =55 °C — — 1.2 mA DTJ = 120 °C — — 5.5 mA PTJ = 150 °C — — 11 IDDSTBY256(12) CC D Total standby mode current on VDD_LV and VDD_HV supply, 256 KB RAM(13) TJ = 25 °C — 190 680 µA CTJ =40 °C — — 1 mA DTJ =55 °C — — 1.5 mA DTJ = 120 °C — 2.3 7 PTJ = 150 °C — 5 14 IDDSSWU1 CC D SSWU running over all STANDBY period with OPC/TU commands execution and keeping ADC off(14) TJ =40 °C — 1 3.5 mA IDDSSWU2 CC D SSWU running over all STANDBY period with OPC/TU/ADC commands execution and keeping ADC on(15) TJ =40 °C — 3.5 5 mA 1. The ranges in this table are design targets and actual data may vary in the given range. 2. The leakage considered is the sum of core logic and RAM memories. The contribution of analog modules is not considered, and they are computed in the dynamic IDD_LV and IDD_HV parameters. 3. IDD_LKG (leakage current) and IDD_LV (dynamic current) are reported as separate parameters, to give an indication of the consumption contributors. The tests used in validation, characterization and production are verifying that the total consumption (leakage + dynamic) is lower or equal to the sum of the maximum values provided (IDD_LKG +IDD_LV). The two parameters, measured separately, may exceed the maximum reported for each, depending on the operative conditions and the software profile used. 4. Use case: 3 x e200Z4 @200 MHz with all locksteps on, HSM @100 MHz, all IPs clock enabled, Flash access with prefetch disabled, Flash consumption includes parallel read and program/erase, all SARADC in continuous conversion, DMA continuously triggered by ADC conversion, 4 DSPI / 8 CAN / 8 LINFlex / FlexRay / ENET0 / ENET1 / eMMC and OctoSPI transmitting, RTC and STM running, 2 x EMIOS running (8 channels in OPWMT mode), FIRC, SIRC, FXOSC, PLL0-1 running. The switching activity estimated for dynamic consumption does not include I/O toggling, which is highly dependent on the application. Details of the software configuration are available separately. The total device consumption is IDD_LV + IDD_HV + IDD_LKG for the selected temperature. 5. GW use case: three cores running @200 MHz, no lockstep, HSM @100 MHz, INTC enabled, 1 EDMA triggered by ADC, PLL0 @200 MHz PLL1 @200 MHz, XOSC = 8/40 MHz, FLASH read only 25%, 12 x CAN running @40 MHz data 4 Mbps/1 Mbps/500 Kbps, 2 x SARADC running @15 MHz with 16 conversion channels, ETH 1 Gbps, OctoSPI @200 Mhz data 100 MB/sec, all other peripherals frozen. Table 8. Device consumption (continued) Symbol C Parameter Conditions Value(1) Unit Min Typ Max |
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