DS0147 datasheet(98/128 Pages) MICROCHIP

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DAT

6.7.4

Digest Cycles

Digests verify the integrity of the programmed non-volatile data. Digests are a cryptographic hash of various

data areas. Any digest that reports back an error raises the digest tamper flag.

Table 120 • Maximum Number of Digest Cycles

Retention Since Programmed (N = Number Digests During that Time)

Reten-

tion

Unit

N = 6000

N = 4000

N = 2000

N = 1500

N = 1000

N = 500

N ≤30

Storage and

Operating TJ

Digest TJ

Years

°C

2 × LF

4 × LF

8 × LF

10 × LF

12 × LF

17 × LF

20 × L-

–40 to 100

–40 to 1

Years

°C

2 × LF

4 × LF

8 × LF

10 × LF

12 × LF

17 × LF

20 × L-

0 to 100

–40 to 1

Years

°C

4 × LF

8 × LF

16 × LF

20 × LF

20 × L-

–40 to 85

–40 to 8

Years

°C

20 × LF

20 × L-

–40 to 55

–40 to 5

1. LF = Lifetime factor as defined by the number of programming cycles the device has seen under the

conditions listed in the following table.

Table 121 • FPGA Programming Cycles Lifetime Factor

Programming Cycles

Programming TJ

500

–40 °C to 100 °C

0.8

1000

–40 °C to 85 °C

0.6

2000

–40 °C to 55 °C

Notes:

• The maximum number of device digest cycles is 100K.

• Digests are operational only over the –40 °C to 100 °C temperature range.

• After a program cycle, an additional N digests cycles are allowed with the resultant retention

characteristics for the total operating and storage temperature shown.

• Retention is specified for total device storage and operating temperature.

• All temperatures are junction temperatures (TJ).

Microsemi Proprietary and Confidential. DS0147 Revision 1.0

AC Switching Characteristics

DS0147 Datasheet(PDF) 98 Page - Microchip Technology

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