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SH32N65DM6AG Datasheet(PDF) 3 Page - STMicroelectronics |
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SH32N65DM6AG Datasheet(HTML) 3 Page - STMicroelectronics |
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3 / 14 page ![]() 2 Electrical characteristics TC = 25 °C unless otherwise specified Table 4. On/off states Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)DSS Drain-source breakdown voltage VGS = 0 V, ID = 1 mA 650 V IDSS Zero gate voltage drain current VGS = 0 V, VDS = 650 V 5 μA VGS = 0 V, VDS = 650 V, TC(1) 300 IGSS Gate-body leakage current VDS = 0 V, VGS = ±25 V ±5 μA VGS(th) Gate threshold voltage VDS = VGS, ID = 250 μA 3.25 4 4.75 V RDS(on) Static drain-source on resistance VGS = 10 V, ID = 23 A 89 97 mΩ 1. Specified by design, not tested in production. Table 5. Dynamic characteristics Symbol Parameter Test conditions Min. Typ. Max. Unit Ciss Input capacitance VDS = 100 V, f = 1 MHz, VGS = 0 V - 2211 - pF Coss Output capacitance - 106 - pF Crss Reverse transfer capacitance - 0.3 - pF Coss eq.(1) Equivalent output capacitance VDS = 0 to 520 V, VGS = 0 V - 396 - pF RG Intrinsic gate resistance f = 1 MHz, ID = 0 A - 1.5 - Ω Qg Total gate charge VDD = 520 V, ID = 37 A, VGS = 0 to 10 V (see Figure 13. Test circuit for gate charge behavior) - 47 - nC Qgs Gate-source charge - 16 - nC Qgd Gate-drain charge - 18 - nC 1. Coss eq is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS. Table 6. Switching characteristics (resistive load) Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) Turn-on delay time VDD = 325 V, ID = 18.5 A, RG = 4.7 Ω , VGS = 10 V (see Figure 12. Switching times test circuit for resistive load and Figure 17. Switching time waveform) - 23 - ns tr Rise time - 10 - ns td(off) Turn-off delay time - 54 - ns tf Fall time - 9 - ns SH32N65DM6AG Electrical characteristics DS14049 - Rev 2 page 3/14 |
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