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IS62C256AL Datasheet(PDF) 9 Page - Integrated Silicon Solution, Inc |
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IS62C256AL Datasheet(HTML) 9 Page - Integrated Silicon Solution, Inc |
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9 / 12 page ![]() Integrated Silicon Solution, Inc. — 1-800-379-4774 9 Rev. A 03/17/06 ISSI® IS65C256AL IS62C256AL DATA RETENTION SWITCHING CHARACTERISTICS Symbol Parameter Test Condition Min. Typ. Max. Unit VDR VDD for Data Retention See Data Retention Waveform 2.0 5.5 V IDR Data Retention Current VDD = 2.0V, CE ≥ VDD – 0.2V Com. — — 15 µA VIN ≥ VDD – 0.2V, or VIN ≤ VSS + 0.2V Ind. — — 20 Auto. — — 50 tSDR Data Retention Setup Time See Data Retention Waveform 0 — ns tRDR Recovery Time See Data Retention Waveform tRC —ns Note: 1. Typical Values are measured at VDD = 5V, TA = 25oC and not 100% tested. DATA RETENTION WAVEFORM ( CE CE CE CE CE Controlled) VDD CE ≥ VDD - 0.2V tSDR tRDR VDR CE GND 4.5V 2.2V Data Retention Mode |
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