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PLUS16R4DA Datasheet(PDF) 11 Page - NXP Semiconductors |
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PLUS16R4DA Datasheet(HTML) 11 Page - NXP Semiconductors |
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11 / 16 page ![]() Philips Semiconductors Programmable Logic Devices Product specification PLUS16R8D/-7 SERIES PAL devices 16L8, 16R8, 16R6, 16R4 September 10, 1993 46 AC ELECTRICAL CHARACTERISTICS R1 = 200Ω, R2 = 390Ω, 0°C ≤ Tamb ≤ +75°C, 4.75 ≤ VCC ≤ 5.25V LIMITS SYMBOL PARAMETER FROM TO –7 D UNIT MIN1 TYP MAX MIN1 MAX Pulse Width tCKH Clock High CK+ CK– 5 7 ns tCKL Clock Low CK– CK+ 5 7 ns tCKP Period CK+ CK+ 10 14 ns Setup & Hold time tIS Input Input or feedback CK+ 7 9 ns tIH Input CK+ Input or feedback 0 0 ns Propagation delay tCKO Clock CK ± Q ± 3 6.5 3 7.5 ns tCKF Clock3 CK ± Q 3 6.5 ns tPD Output (16L8, R6, R4)2 I, B Output 3 7.5 3 10 ns tOE1 Output enable4 OE Output enable 3 8 3 10 ns tOE2 Output enable4,5 I Output enable 3 10 3 10 ns tOD1 Output disable4 OE Output disable 3 8 3 10 ns tOD2 Output disable4,5 I Output disable 3 10 3 10 ns tSKW Output Q Q 1 1 ns tPPR Power-Up Reset VCC+ Q+ 10 10 ns Frequency (16R8, R6, R4) No feedback 1/ (tCKL + tCKH)6 100 71.4 MHz fMAX Internal feedback 1/ (tIS + tCKF)6 90 64.5 MHz External feedback 1/ (tIS + tCKO)6 74 60.6 MHz * For definitions of the terms, please refer to the Timing/Frequency Definitions tables. NOTES: 1. CL = 0pF while measuring minimum output delays. 2. tPD test conditions: CL = 50pF (with jig and scope capacitance), VIH = 3V, VIL = 0V, VOH = VOL = 1.5V. 3. tCKF was calculated from measured Internal fMAX. 4. For 3-State output; output enable times are tested with CL = 50pF to the 1.5V level, and S1 is open for high-impedance to High tests and closed for high-impedance to Low tests. Output disable times are tested with CL = 5pF. High-to-High impedance tests are made to an output voltage of VT = (VOH – 0.5V) with S1 open, and Low-to-High impedance tests are made to the VT = (VOL + 0.5V) level with S1 closed. 5. Same function as tOE1 and tOD1, with the difference of using product term control. 6. Not 100% tested, but calculated at initial characterization and at any time a modification in design takes place which may affect the frequency. |
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