Total Supply Voltage

Peak Output Current (within S.O.A.)

Input Voltage

Input Voltage

Junction Temperature

60V

10A

(-VCC)-0.5V to (+VCC)+0.5V

(-VCC)-0.1V to (+VCC)-3V

Internal Protection

(See Application Note)

Storage Temperature Range

Lead Temperature Range

(10 seconds)

Case Operating Temperature

MSK186H/E

MSK186

Thermal Resistance (Per Amplifier)

Junction to Case @ 125°C

STATIC

Supply Voltage Range

INPUT

Input Offset Voltage

Input Offset Voltage Drift

Input Bias Current

Input Offset Current

Input Impedance

Input Capacitance

Common Mode Rejection Ratio

Input Voltage Noise Density

OUTPUT

Output Current

Output Disable Time

Output Enable Time

TRANSFER CHARACTERISTICS

Slew Rate

Open Loop Voltage Gain

Settling Time ±0.1%

Max.

60

±35

±38

-

±7.5

-

±500

±50

-

-

-

-

-

-

-

-

VR+0.8

-

-

-

-

-

-

-

-65°C to +150°C

300°C

-55°C to +125°C

-25°C to +85°C

1.2°C/W

1

2

3

4

5

6

7

ABSOLUTE MAXIMUM RATINGS

-Vcc to +Vcc

f=DC Differential

f=DC Differential

Continuous

Ω

Ω

Group A

Subgroup

-

1

2,3

-

1

-

1

1

-

-

1

-

4

4

4

4

4

-

-

-

-

-

4

-

Typ.

-

±26

±26

±6

±1

±20

±100

±5

10

6

95

70

±27.5

±26

-

-

-

-50

-55

1

3

9

110

20

Min.

8

-

-

-

-

-

-

±1

-

-

80

-

±26.5

±25

±8

VR+2.4

-

-

-

-

-

-

100

-

Min.

8

-

-

-

-

-

-

-

-

-

75

-

±26.5

±25

±8

VR+2.4

-

-

-

-

-

-

100

-

Max.

60

±38

-

-

±10

-

±750

±75

-

-

-

-

-

-

-

-

VR+0.8

-

-

-

-

-

-

-

Typ.

-

±26

-

±6

±1

±20

±100

±5

10

6

95

70

±27.5

±26

-

-

-

-50

-55

1

3

9

110

20

Units

V

mA

mA

mA

mV

µV/°C

Ω

pF

dB

nV/

V

V

A

V

V

µA

µA

µS

µS

V/µS

dB

µS

MSK186H/E

MSK186

Parameter

Test Conditions

ELECTRICAL SPECIFICATIONS

1

NOTES:

Quiescent Current (Per Amp)

2

Quiescent Current (Per Amp)

7

7

Enable/

Shutdown Input

Output Voltage Swing

3

3

3

3

3

2

3

3

3

3

All electrical specifications apply to each amplifier.

Devices shall be capable of meeting the parameter, but need not to be tested. Typical parameters are for reference only.

Industrial grade and 'E' suffix devices shall be tested to subgroups 1 and 4 unless otherwise specified.

Military grade devices ('H' suffix) shall be 100% tested to subgroups 1,2,3 and 4.

Subgroup 2

Subgroup 3

Continuous operation at or above absolute maximum ratings may adversely effect the device performance and/or life cycle.

7

PRELIMINARY

Rev. B 11/06