SP526_06 datasheet(19/24 Pages) SIPEX

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Rev: C Date:2/1/06

SP526 Multi–Mode Serial Transceiver

Phase 4

— V

DD transfer — The fourth phase of the clock

connects the negative terminal of C

2 to ground,

and transfers the generated l0V across C

2 to C4,

the V

DD storage capacitor. Again, simultaneously

with this, the positive side of capacitor C

1 is

switched to +5V and the negative side is con-

nected to ground, and the cycle begins again.

Since both V+ and V– are separately generated

from V

CC; in a no–load condition V

+ and V– will

be symmetrical. Older charge pump approaches

that generate V– from V+ will show a decrease in

the magnitude of V– compared to V+ due to the

inherent inefficiencies in the design.

The clock rate for the charge pump typically

operates at 15kHz. The external capacitors can

be as low as 1.0

µF with a 16V breakdown

voltage rating.

ESD Tolerance

The SP526 device incorporates ruggedized

ESD cells on all driver output and receiver input

pins. The ESD structure is improved over our

previous family for more rugged applications

and environments sensitive to electro-static

discharges and associated transients. The

improved ESD tolerance is at least

±15kV

without damage nor latch-up.

There are different methods of ESD testing

applied:

a) MIL-STD-883, Method 3015.7

b) IEC1000-4-2 Air-Discharge

c) IEC1000-4-2 Direct Contact

The Human Body Model has been the generally

accepted ESD testing method for semiconductors.

This method is also specified in MIL-STD-883,

Method 3015.7 for ESD testing. The premise of

this ESD test is to simulate the human body’s

potential to store electro-static energy and

discharge it to an integrated circuit. The

simulation is performed by using a test model as

shown in Figure 35. This method will test the

IC’s capability to withstand an ESD transient

during normal handling such as in manufacturing

areas where the ICs tend to be handled frequently.

The IEC-1000-4-2, formerly IEC801-2, is

generally used for testing ESD on equipment and

systems. For system manufacturers, they must

guarantee a certain amount of ESD protection

since the system itself is exposed to the outside

environment and human presence. The premise

with IEC1000-4-2 is that the system is required

to withstand an amount of static electricity when

ESD is applied to points and surfaces of the

equipment that are accessible to personnel during

normal usage. The transceiver IC receives most

DC Power

Source

SW2

Device

Under

Test

Figure 35. ESD Test Circuit for Human Body Model

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