DS1284/DS1286

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NOTES:

1.

WE is high for a read cycle.

2.

low to the earlier of

CE or WE going high.

6. If the

CE low transition occurs simultaneously with or later than the WE low transition in write cycle

1, the output buffers remain in a high-impedance state during this period.

7. If the

CE high transition occurs prior to or simultaneously with the WE high transition, the output

buffers remain in a high-impedance state during this period.

8. If

WE is low or the WE low transition occurs prior to or simultaneously with the CE low transition,

the output buffers remain in a high-impedance state during this period.

9. Each DS1284/DS1286 is marked with a four-digit date code AABB. AA designates the year of

date of manufacture.

10. All voltages are referenced to ground.

11. Applies to both interrupt pins when the alarms are set to pulse.

12. Interrupt output occurs within 100ns on the alarm condition existing.

13.

RTC modules can be successfully processed through conventional wave-soldering techniques as long

as temperature exposure to the lithium energy source contained within does not exceed +85°C.

However, post-solder cleaning with water-washing techniques is acceptable, provided that ultrasonic

vibrations are not used to prevent crystal damage.

AC TEST CONDITIONS

Output Load: 100pF + 1TTL Gate

Input Pulse Levels: 0 to 3.0V

Timing Measurement Reference Levels

Input: 1.5V

Output: 1.5V

Input Pulse Rise and Fall Times: 5ns