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AS1110 Datasheet(PDF) 19 Page - ams-OSRAM AG |
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AS1110 Datasheet(HTML) 19 Page - ams-OSRAM AG |
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19 / 26 page ![]() www.ams.com/LED-Driver-ICs/AS1110 Revision 1.6 17 - 24 AS1110 Datasheet - Application In form atio n 9 Application Information 9.1 Error Detection The AS1110 features two types of error detection. The error detection can be used on-the-fly, for active LEDs, without any delay, or by entering into low-current diagnosis mode. 9.1.1 Error Detection On-The-Fly Error detection on-the-fly will output the status of active LEDs during operation. Without choosing an error mode this will output the temperature flag at every input/output cycle. Triggering one clock pulse for open or two clock pulses for short detection during error detection mode outputs the detailed open- or short-error report with the next input/output cycle (see Figure 19). LEDs turned off at test time are not tested and will show a logic "1" at the detailed error report. Figure 19. Normal Operation with Error Detection During Operation – 64 Cascaded AS1110s 9.1.2 Error Detection with Low-Current Diagnosis Mode This unique feature of the AS1110 uses an internal all 1s test pattern for a flicker free diagnosis of all LEDs. This error detection mode can be started at the end of each input cycle (see Figure 20). Figure 20. Low-Current Diagnosis Mode with Internal All 1s Test Pattern – 64 Cascaded AS1110s Display SDI SDO CLK OEN LD Current Data1 Data2 Data3 T/O or S Error Code Data1 T/O or S Error Code Data0 Data0 T/O or S Error Code Data2 1024x 1024x 1024x Clock for Error Mode 0x/1x/2x Rising Edge of OEN Acquisition of Error Status Falling Edge of LD; Error Register is copied into Shift Register ≤ 100mA GEF GEF GEF = Global Error Flag Falling Edge of LD; Error Register is copied into Shift Register Clock for Error Mode 0x/1x/2x Rising Edge of OEN Acquisition of Error Status Data2 Data3 Data4 Clock for Error Mode 1x/2x 3x Clocks Low- Current Mode GEF 1024x 1024x Data0 Rising Edge of OEN Acquisition of Error Status Falling Edge of LD; Error Register is cop- ied into Shift Register GEF O or S Error Code from All 1s Test Pattern Temperature Error Code Use Internal All 1s Test Pattern ≤ 100mA ≤ 100mA SDI SDO CLK OEN LD ≤ 0.8mA GEF = Global Error Flag 1024x Data1 Data2 T/O or S Error Code Data0 GEF Display Current Low-Current Diagnosis Mode Data2 Data3 Data1 |
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