SMTHDT80 datasheet(3/6 Pages) STMICROELECTRONICS

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REFERENCE TEST CIRCUIT FOR IH,IBO and VBO parameters :

static

relay.

240

140

D.U.T

VBO

measure

I, I

measure

Tp = 20ms

Transformer

220V/ 800V

Auto

Transformer

220V/2A

Vout

TEST PROCEDURE :

Pulse Test duration (Tp = 20ms):

- For Bidirectional devices = Switch K is closed

- For Unidirectional devices = Switch K is open.

VOUT Selection

- Device with VBR

≤ 150 Volt

-VOUT = 250 VRMS,R1 = 140

Ω.

- Device with VBR

≥ 150 Volt

-VOUT = 480 VRMS,R2 = 240

Ω.

FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT = GO - NOGO TEST.

D.U.T

Switch

Vp =

1KV

Surge Generator

10/700

sec

Vp =1KV / Ipp = 25A

220nF

Vbat = 48V

This is a GO-NOGO Test which allows to confirm the holding current (IH) level in a functional test

circuit. This test can be performed if the reference test circuit can’t be implemented.

TEST PROCEDURE :

1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T.

2) Fire the D.U.T with a surge Current : Ipp = 25A , 10/700

µs.

3) The D.U.T will come back to the OFF-State within a duration of 50 ms max.

SMTHDTxx

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