| Electronic Components Datasheet Search |
|
H8SX/1663M Datasheet(PDF) 1237 Page - Renesas Technology Corp |
|
|
|||||||||||||||||||||||||||||
H8SX/1663M Datasheet(HTML) 1237 Page - Renesas Technology Corp |
|
1237 / 1504 page ![]() Section 26 Boundary Scan Rev. 2.00 Sep. 24, 2008 Page 1205 of 1468 REJ09B0412-0200 Section 26 Boundary Scan This LSI has boundary scan function, which is a serial I/O interface based on the JTAG (Joint Test Action Group, IEEE Std.1149.1 and IEEE Standard Test Access Port and Boundary-Scan Architecture). 26.1 Features • Boundary scan valid single chip mode when the EMLE pin= 0 in MCU operating mode 3 • P62, P63, P64, P65, and WDTOVF are pins only for boundary scan when boundary scan is valid • Six test modes: BYPASS mode EXTEST mode SAMPLE/PRELOAD mode CLAMP mode HIGHZ mode IDCODE mode |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |