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SPT7610

ELECTRICAL SPECIFICATIONS

TEST

TEST

SPT7610

PARAMETERS

CONDITIONS

LEVEL

MIN

TYP

MAX

UNITS

Timing Characteristics

Data Bank A

+25 °C case

V

1.68

ns

Data Bank B

+25 °C case

V

1.73

ns

Data Bank A

+25 °C case

V

2.14

ns

Data Bank B

+25 °C case

V

2.00

ns

Data Bank A

–40 to 85 °C case

IV

1.54

ns

Data Bank B

–40 to 85 °C case

IV

1.73

ns

–40 to 85 °C case

IV

–150

150

ps

Aperture Jitter

V

2

ps

Acquisition Time

V

250

ps

Dynamic Performance

Spurious Free Dynamic Range (SFDR)

V

45

dB

V

34

dB

Signal-to-Noise and Distortion (SINAD)

VI

31

34

dB

VI

28

32

dB

Signal to Noise Ratio (SNR)

VI

33

36

dB

VI

32

36

dB

Total Harmonic Distortion (THD)

VI

–40

–37

dB

VI

–34

–30

dB

TEST LEVEL CODES

All electrical characteristics are subject to the

following conditions:

All parameters having min/max specifications

are guaranteed. The Test Level column indi-

cates the specific device testing actually per-

formed during production and Quality Assur-

ance inspection. Any blank section in the data

column indicates that the specification is not

tested at the specified condition.

Unless otherwise noted, all test are pulsed

LEVEL

TEST PROCEDURE

I

100% production tested at the specified temperature.

II

specified temperatures.

III

QA sample tested only at the specified temperatures.

IV

Parameter is guaranteed (but not tested) by design and characteri-

zation data.

V

Parameter is a typical value for information purposes only.

VI

over specified temperature range.