AS8E512K8

Rev. 3.1 6/05

Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.

4

EEPROM

EEPROM

EEPROM

EEPROM

EEPROM

AS8E512K8

Austin Semiconductor, Inc.

NOTES:

1. CE\ may be delayed up to t

ACC

-t

CE

after the address transi-

tion without inpact on t

ACC

.

2. OE\ may be delayed up to t

CE

-t

OE

after the falling edge of

CE\ without inpact on t

CE

or by t

ACC

-t

OE

after an address

change without inpact on t

ACC

.

3. t

(C

4. This parameter is characterized and is not 100% tested.

5. A17 and A18 must remain valid through the WE\ and CE\

low pulse.

ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC READ OPERATING

INPUT TEST WAVEFORMS AND MEASUREMENT

LEVEL FOR AC TEST CONDITIONS

In put P u ls e Leve ls

0 V to 3.0V

In put R ise an d F a ll T im e s

5 nS

In put an d O u tp ut

1.5V

Tim in g R e fe re n c e Le ve ls

OUTPUT TEST LOAD

100pF

1.8K

1.3K

5.0V

ADDRESS

CE\

OE\

OUTPUT

OUTPUT

HIGH Z

t

OE

t

ACC

t

DF

t

CE

ADDRESS VALID

t

OH

VALID










   











   













   





















     





















     


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