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MCP4017 Datasheet(PDF) 3 Page - Microchip Technology |
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MCP4017 Datasheet(HTML) 3 Page - Microchip Technology |
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3 / 66 page ![]() © 2009 Microchip Technology Inc. DS22147A-page 3 MCP4017/18/19 1.0 ELECTRICAL CHARACTERISTICS Absolute Maximum Ratings † Voltage on VDD with respect to VSS ..... -0.6V to +7.0V Voltage on SCL, and SDA with respect to VSS ............................................................................. -0.6V to 12.5V Voltage on all other pins (A, W, and B) with respect to VSS ............................ -0.3V to VDD + 0.3V Input clamp current, IIK (VI < 0, VI > VDD, VI > VPP ON HV pins) ........... ±20 mA Output clamp current, IOK (VO < 0 or VO > VDD) ....................................... ±20 mA Maximum output current sunk by any Output pin ........................................................................... 25 mA Maximum output current sourced by any Output pin ........................................................................... 25 mA Maximum current out of VSS pin ...................... 100 mA Maximum current into VDD pin ......................... 100 mA Maximum current into A, W and B pins........... ±2.5 mA Package power dissipation (TA = +50°C, TJ = +150°C) SC70-5............................................................ 302 mW SC70-6.................................................................. TBD Storage temperature .......................... -65°C to +150°C Ambient temperature with power applied ........................................................... -40°C to +125°C ESD protection on all pins ........................≥ 4 kV (HBM) ........................................................................≥ 400V (MM) Maximum Junction Temperature (TJ) .............. +150°C † Notice: Stresses above those listed under “Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. |
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