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LSRFSBK2093-R1-PF Datasheet(PDF) 7 Page - LIGITEK electronics co., ltd.

Part # LSRFSBK2093-R1-PF
Description  DUAL COLOR LED LAMPS
PDF  7 Pages
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Manufacturer  LIGITEK [LIGITEK electronics co., ltd.]
Direct Link  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

LSRFSBK2093-R1-PF Datasheet(HTML) 7 Page - LIGITEK electronics co., ltd.

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LSRFSBK2093/R1-PF
PART NO.
Page 6/6
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Reference
Standard
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
Description
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
MIL-STD-883:1008
JIS C 7021: B-10
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
Reliability Test:
Test Item
Operating Life Test
High Temperature
Storage Test
Test Condition
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
JIS C 7021: B-12
MIL-STD-202:103B
JIS C 7021: B-11
The purpose of this test is the resistance
of the device under tropical for hours.
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
This test intended to see soldering well
performed or not.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
High Temperature
High Humidity Test
1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
Thermal Shock Test
Solderability Test
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
Solder Resistance
Test
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
Low Temperature
Storage Test



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