WM2626

Production Data

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 April 2001

2

PIN CONFIGURATION

1

2

3

4

NCS

DIN

SCLK

GND

REF

OUTA

VDD

OUTB

5

6

7

8

PIN DESCRIPTION

PIN NO

NAME

TYPE

DESCRIPTION

1

DIN

Digital input

Serial data input

2

SCLK

Digital input

Serial clock input

3

NCS

Digital input

Chip select. This pin is active low.

4

OUTA

Digital input

DAC A analogue voltage output

5

GND

Supply

Ground

6

REF

Analogue in/out

Voltage reference

7

OUT

Analogue output

DAC B analogue voltage output

8

VDD

Supply

Positive power supply

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified.

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible

to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage

of this device.

CONDITION

MIN

MAX

Supply voltage, VDD to GND

7V

Digital input voltage

-0.3V

VDD + 0.3V

Reference input voltage

-0.3V

VDD + 0.3V

WM2626CD

WM2626ID

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Soldering lead temperature, 1.6mm (1/16 inch) from package body for

10 seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

VDD

2.7

5.5

V

High-level digital input voltage

VDD = 2.7V to 5.5V

2

V

Low-level digital input voltage

VDD = 2.7V to 5.5V

0.8

V

Reference voltage to REF pin

See Note

GND

VDD - 1.5

V

Load resistance

2k

Ω

Load capacitance

100

pF

Serial clock frequency

20

MHz

WM2626CD

0

70

°C

Operating free-air temperature

WM2626ID

-40

85

°C

Note: Reference input voltages greater than VDD/2 will cause clipping for large DAC codes.