WM8191 datasheet(9/27 Pages) WOLFSON

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WM8191

WOLFSON MICROELECTRONICS LTD

AI Rev 3.1 April 2001

PARALLEL INTERFACE

STB

OP[13:6]

DNA

RNW

ADC DATA OUT

REG. DATA OUT

ADC DATA OUT

Hi-Z

ASU

STB

DSU

STDO

STAO

ADLS

ADLH

ADHS

ADHH

OPD

ADDRESS IN

DATA IN

OPZ

Figure 5 Parallel Interface Timing

Test Conditions

AVDD1 = AVDD2 = DVDD1 = 4.75 to 5.25V, DVDD2 = DVDD3 = 2.97 to 3.63V, AGND = DGND = 0V, TA = 0 to 70

°C,

MCLK = 12MHz unless otherwise stated.

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNITS

RNW low to OP[13:6] Hi-Z

tOPZ

Address set-up time to STB low

tASU

0ns

DNA low set-up time to STB low

tADLS

Strobe low time

tSTB

Address hold time from STB high

tAH

DNA low hold time from STB high

tADLH

Data set-up time to STB low

tDSU

0ns

DNA high set-up time to STB low

tADHS

Data hold time from STB high

tDH

Data high hold time from STB high

tADHH

RNW high to OP[13:6] output

tOPD

Data output propogation delay from

STB low

tSTDO

ADC data out propogation delay

from STB high

tSTAO

Note:

Parameters are measured at 50% of the rising/falling edge.

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