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51-650 Echotel SIL Safety Manual

5.6.3 Malfunction Test Push Button

The malfunction test push button is used to manually test

the SPDT malfunction relay and whatever is connected to

the relay. Pressing and holding this push button for 2 seconds

causes the SPDT relay to de-engage, indicating a fault

condition. The malfunction test push button is an option

for both the Model 961 and Model 962 in line-powered

configuration only.

5.6.4 High/Low DIP Switch

The Hi/Lo DIP switch is used to select whether the switch

is used as a high-level fail-safe or a low-level fail-safe switch.

See Section 2.5 of the Echotel Model 961/962 Ultrasonic

Single and Dual Point Level Switches Installation and

Operating Manual (Bulletin 51.646) for high/low DIP

switch configuration tables.

5.6.5 Independent/Joint DIP Switch

The I/J DIP switch is used to configure the SPDT malfunc-

tion relay to act independently or jointly with the DPDT

process-level relay. In the factory-set I position, the SPDT

and DPDT relays act independent of each other. In the

J position, both the SPDT and DPDT relays will de-engage

when a fault is detected. The I/J DIP switch is an option for

the Model 961 in line-powered configuration only.

5.6.6 Loop Test Push Button

The loop test push button is used to manually test the loop

current output. For Model 961, pressing the loop test push

button reverses the output from 8 mA to 16 mA or from

16 mA to 8 mA. For Model 962, pressing the loop test push

button changes the output from 8 mA to 12 mA, 12 mA to

16 mA, or 16 mA to 8 mA.