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CBTL04DP211 Datasheet(PDF) 7 Page - NXP Semiconductors |
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CBTL04DP211 Datasheet(HTML) 7 Page - NXP Semiconductors |
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7 / 17 page ![]() CBTL04DP211 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 1 — 30 March 2011 7 of 17 NXP Semiconductors CBTL04DP211 DisplayPort 2 : 1 multiplexer 9. Limiting values [1] Human Body Model: ANSI/EOS/ESD-S5.1-1994, standard for ESD sensitivity testing, Human Body Model - Component level; Electrostatic Discharge Association, Rome, NY, USA. [2] Charged Device Model: ANSI/EOS/ESD-S5.3-1-1999, standard for ESD sensitivity testing, Charged Device Model - Component level; Electrostatic Discharge Association, Rome, NY, USA. 10. Recommended operating conditions [1] HPD input is tolerant to 5 V input, provided a 1 k series resistor between the voltage source and the pin is placed in series. See Section 12.1 “Special considerations”. [2] AUX input is tolerant to 5 V input, provided a 2.2 k series resistor between the voltage source and the pin is placed in series. See Section 12.1 “Special considerations”. Table 7. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDD supply voltage 0.3 +5 V Tcase case temperature 40 +85 C VESD electrostatic discharge voltage HBM [1] - 8000 V HBM; CMOS inputs [1] - 2000 V CDM [2] - 1000 V CDM; CMOS inputs [2] 500 V Table 8. Recommended operating conditions Symbol Parameter Conditions Min Typ Max Unit VDD supply voltage 3.0 3.3 3.6 V VI input voltage CMOS inputs 0.3 - VDD +0.3 V Main Link 0.3 - VDD +0.3 V HPD inputs [1] 0.3 - VDD +0.3 V AUX [2] 0.3 - VDD +0.3 V Tamb ambient temperature operating in free air 40 - +85 C |
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