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MCP41010E/P Datasheet(PDF) 11 Page - Microchip Technology |
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MCP41010E/P Datasheet(HTML) 11 Page - Microchip Technology |
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11 / 32 page  2003 Microchip Technology Inc. DS11195C-page 11 MCP41XXX/42XXX 2.1 Parametric Test Circuits FIGURE 2-25: Potentiometer Divider Non- Linearity Error Test Circuit (DNL, INL). FIGURE 2-26: Resistor Position Non- Linearity Error Test Circuit (Rheostat operation DNL, INL). FIGURE 2-27: Wiper Resistance Test Circuit. FIGURE 2-28: Power Supply Sensitivity Test Circuit (PSS, PSRR). FIGURE 2-29: Gain vs. Frequency Test Circuit. FIGURE 2-30: Capacitance Test Circuit. V+ A B W VMEAS* V+ = VDD 1LSB = V+/256 DUT *Assume infinite input impedance + - A B W DUT IW *Assume infinite input impedance VMEAS* No Connection + - B DUT W + - ISW Rsw = 0.1V Isw Code = 00h 0.1V VSS = 0 to VDD A V+ A B W DUT VA V+ = VDD ± 10% PSRR (dB) = 20LOG ∆VMEAS ) ( PSS (%/%) = ∆VDD ∆VMEAS VDD *Assume infinite input impedance VMEAS* ∆VDD + - VIN - + +5V VOUT 2.5V DC OFFSET GND A B DUT W ~ VIN - + +5V VOUT MCP601 2.5V DC Offset A B DUT ~ |
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