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AM79C100JC Datasheet(PDF) 9 Page - Advanced Micro Devices |
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AM79C100JC Datasheet(HTML) 9 Page - Advanced Micro Devices |
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9 / 24 page ![]() Am79C100 9 Signal Quality Error (SQE) Test (Heartbeat) Function When the SQE TEST pin is driven LOW, TPEX Plus will routinely exercise the collision detection circuitry by generating an SQE Test message at the end of every transmission. This signal is a self-test indication to the DTE that the MAU collision circuitry is functional and the AUI cable/connection is intact. An SQE Test mes- sage consists of a 10 MHz signal on the CI ± pair with a duration of 5 to 15 bit times (500 ns to 1500 ns). When enabled, an SQE Test will occur at the end of every transmission, starting 6 to 16 bit times (600 ns to 1600 ns) after the last transition of the transmitted sig- nal. For repeater applications, the SQE Test function can be disabled by tying the SQE TEST pin HIGH or by leaving it disconnected. The COL output will remain in- active during the SQE Test message on CI ±. Jabber Function The Jabber function inhibits the twisted-pair transmit function of TPEX Plus if the DO ± circuit is active for an excessive period (20 ms to 150 ms). This prevents any one node from disrupting the network due to a “stuck on” or faulty transmitter. If this maximum trans- mit time is exceeded, the TPEX Plus transmitter cir- cuitry is disabled and a 10 MHz signal is driven onto the CI ± pair. Once the transmit data stream is removed from the DO ± input pair, an “unjab” time of 250 ms to 750 ms will elapse before the TPEX Plus removes the 10 MHz signal from the CI ± pair and re-enables the transmit circuitry. When jabber is detected, TPEX Plus will activate the COL driver, disable the XMT driver (regardless of DO ± activity), and allow the RCV driver to indicate the current state of the RXD ± pair. If there is no receive ac- tivity on RXD ±, only COL will be active during Jabber Detect. If there is RXD ± activity, both COL and RCV will be active. Power Down In addition to on-board power-on-reset circuitry, the PRDN/RST pin is used as the master reset for TPEX Plus. PRDN/RST must be driven LOW for a minimum of 2 µs for reset to occur. The PRDN/RST pin can also be used to put the TPEX Plus into an inactive or “sleep” state, causing the device to consume less power. This feature is useful in battery-powered or low-duty-cycle systems. Driving PRDN/RST LOW resets the internal logic of TPEX Plus and places the device into idle mode. In this mode, the twisted-pair driver pins (TXD ±, TXP ±) are driven LOW, the AUI pins (CI±, DI±) are pulled to AV DD, the LNKST and RXPOL pins are in the inactive state, and the XMT, RCV, and COL pins are in the high-impedance state. TPEX Plus will remain in idle mode as long as PRDN/RST is asserted. Following the rising edge of the signal on PRDN/RST, TPEX Plus will remain in the reset state for up to 10 µs. Immediately after the reset condition is removed, TPEX Plus will drive the XMT, RCV, and COL outputs LOW for 20 ms to 62 ms as a lamp test feature, and will be forced into the Link Fail state. TPEX Plus will move to the Link Pass state only after 5 to 6 link beat pulses and/or a single received message is detected on the RXD ± pair. Test Modes TPEX Plus implements two types of loopback test modes suitable for Station (DTE) or Repeater applica- tions. The test mode is entered by driving the TEST1 pin HIGH. The TEST2 pin is intended for factory test only and should be tied HIGH for test mode or normal operation. The two available test modes are: 1. Station (DTE): SQE TEST pin LOW. Data received on the DO ± input pair is transmitted onto the TXD± and TXP ± output pairs, and data received on the RXD ± input pair is transmitted onto the DI± output pair. 2. Repeater: SQE TEST pin HIGH. Data received on the DO ± input pair is looped back onto the DI± out- put pair, and data received on the RXD ± pair is looped back and retransmitted on the twisted-pair drivers (TXD ± and TXP± pairs). In both modes, TPEX Plus will be forced into the Link Pass state and will not enter the Link Fail state, regard- less of RXD ± inactivity. The following functions are dis- abled: jabber circuit, collision detection, and collision oscillator. The functions that remain enabled are: the DO ± and RXD± squelch circuits, XMT and RCV out- puts, link beat pulse generation, and polarity detection/ correction. In addition, in both modes, the COL pin (not used to indicate collision during test modes) will go ac- tive for the duration of any transmit activity on the TXD ±/TXP± pairs, providing a leading high-to-low edge indicating the start of packet transmission or link beat pulse generation. Upon exiting either of the test modes, the Link Test State Machine will be forced into the Link Fail state. RXPOL may be pulled LOW and receive polarity correction will be disabled. TPEX Plus External Components Figure 1 shows a typical twisted-pair port external com- ponents schematic. The resistors used should have a ±1% tolerance to ensure interoperability with 10BASE-T-compliant networks. The filters and pulse transformers are necessary devices that have a major influence on the performance and compliance of a TPEX Plus-based MAU. Specifically, the transmitted waveforms are heavily influenced by filter characteris- tics and the twisted-pair receivers employ several |
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