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3D3438 Datasheet(PDF) 6 Page - Data Delay Devices, Inc. |
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3D3438 Datasheet(HTML) 6 Page - Data Delay Devices, Inc. |
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6 / 6 page ![]() 3D3438 Doc #10005 DATA DELAY DEVICES, INC. 6 7/8/2010 Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com SILICON DELAY LINE AUTOMATED TESTING TEST CONDITIONS INPUT: OUTPUT: Ambient Temperature: 25 oC 3oC Rload: 10K 10% Supply Voltage (Vcc): 5.0V 0.1V Cload: 5pf 10% Input Pulse: High = 3.0V 0.1V Threshold: 1.5V (Rising & Falling) Low = 0.0V 0.1V Source Impedance: 50 Max. Rise/Fall Time: 3.0 ns Max. (measured between 0.6V and 2.4V ) Pulse Width: PWIN = 2 x Max Delay Period: PERIN = 10 x Max Delay NOTE: The above conditions are for test only and do not in any way restrict the operation of the device. OUT TRIG IN REF TRIG Figure 6: Test Setup DEVICE UNDER TEST (DUT) DIGITAL SCOPE/ TIME INTERVAL COUNTER PULSE GENERATOR OUT IN COMPUTER SYSTEM PRINTER Figure 7: Timing Diagram tPLH tPHL PERIN PWIN tRISE tFALL 0.6 0.6 1.5 1.5 2.4 2.4 1.5 1.5 VIH VIL VOH VOL INPUT SIGNAL OUTPUT SIGNAL 10K 470 5pf Device Under Test Digital Scope |
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