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A6986F Datasheet(PDF) 65 Page - STMicroelectronics |
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A6986F Datasheet(HTML) 65 Page - STMicroelectronics |
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65 / 72 page ![]() DocID027739 Rev 1 65/72 A6986F EMC testing results 72 Figure 59. CE 150R at VS1 test point (see Figure 58) at 80% ILOAD Figure 60. CE 150R at VS1 test point (see Figure 58) at 10% ILOAD Test results (continue): Test case CE #1 - Emission VS / Iload_VOUT = 1.2A -20 -10 0 10 20 30 40 50 60 70 80 90 100 0,1 1 10 100 1000 Limit BISS class II global / 10-K (PK) Limit BISS class III global / 12-M (PK) PK - VS1 AV - VS1 [MHz] [dBµV] CE - 150 Ohm method - Global Pins DUT: Mode: Iload_Vout = 1.2A Test case: Emission VS (VS1) A6986F5V Test case CE #2 - Emission VS / Iload_VOUT = 150mA -20 -10 0 10 20 30 40 50 60 70 80 90 100 0,1 1 10 100 1000 Limit BISS class II global / 10-K (PK) Limit BISS class III global / 12-M (PK) PK - VS1 AV - VS1 [MHz] [dBµV] CE - 150 Ohm method - Global Pins DUT: Mode: Iload_Vout = 150mA Test case: Emission VS (VS1) A6986F5V A6986F5V |
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