RHFL6000A datasheet(13/31 Pages) STMICROELECTRONICS

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RHFL6000A

Radiations

DocID028379 Rev 2

13/31

Radiations

6.1

Total ionizing dose (MIL-STD-883 test method 1019)

The products that are guaranteed in radiation within RHA QML-V system, fully comply with

the MIL-STD-883 test method 1019 specification. The RHFL6000A is being RHA QML-V

qualified, tested and characterized in full compliance with the MIL-STD-883 specification,

both below 10 mrad/s (low dose rate) and between 50 and 300 rad/s (high dose rate).



Testing is performed in accordance with MIL-prf-38535 and the test method 1019 of

the MIL-STD-883 for total ionizing dose (TID).



ELDRS characterization is performed in qualification only on both biased and

unbiased parts, on a sample of ten units from two different wafer lots.



Each wafer lot is tested at high dose rate only, in the worst bias case condition, based

on the results obtained during the initial qualification.

Table 6: TID tests results

Type

Conditions

Value

Unit

TID

50 rad(Si)/s high dose rate up to

300

krad

10 mrad(Si)/s low dose rate up to (1)

100

ELDRS free up to (1)

100

Output voltage radiation drift

From 0 krad to 300 krad at 50 rad/s ,

MIL-STD-883J method 1019.9

<1.1

ppm/krad

Quiescent current

(ON state)

From 0 krad to 300 krad at 50 rad/s ,

MIL-STD-883J method 1019.9

VI = 2.5 V to 12 V, IO = 5 to 30 mA,

TJ = -55 to +125 °C

<15

Notes:

(1)300 krad low dose rate test ongoing.

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