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UT54ACTS541E Datasheet(PDF) 2 Page - Aeroflex Circuit Technology |
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UT54ACTS541E Datasheet(HTML) 2 Page - Aeroflex Circuit Technology |
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2 / 9 page  2 LOGIC DIAGRAM OPERATIONAL ENVIRONMENT1 Notes: 1. Logic will not latchup during radiation exposure within the limits defined in the table. 2. Device storage elements are immune to SEU affects. PARAMETER LIMIT UNITS Total Dose 1.0E6 rads(Si) SEU Threshold 2 80 MeV-cm2/mg SEL Threshold 120 MeV-cm2/mg Neutron Fluence 1.0E14 n/cm2 A1 A2 A3 A4 A5 A6 A8 (1) (2) (3) (4) (5) (6) (7) (9) 1G 2G (19) A7 (8) Y1 Y2 Y3 Y4 Y5 Y6 Y8 Y7 (18) (17) (16) (15) (14) (13) (11) (12) |
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