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ADC12062EVAL Datasheet(PDF) 13 Page - National Semiconductor (TI) |
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ADC12062EVAL Datasheet(HTML) 13 Page - National Semiconductor (TI) |
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13 / 20 page ![]() Applications Information (Continued) switching, reducing the op amp transient response require- ments. The 100 pF capacitor should only be used with high speed op amps that are unconditionally stable driving ca- pacitive loads. Another benefit of using a high speed buffer is improved THD performance when using the multiplexer of the ADC12762. The MUX on-resistance is somewhat non-linear over input voltage, causing the RC time constant formed by C IN,RMUX, and RSW to vary depending on the input voltage. This results in increasing THD with increasing frequency. In- serting the buffer between the MUX OUT and the ADC IN terminals as shown in Figure 8 will eliminate the loading on R MUX, significantly reducing the THD of the multiplexed system. Correct converter operation will be obtained for input volt- ages greater than AGND − 50 mV and less than AV CC +50 mV. Avoid driving the signal source more than 300 mV higher than AV CC, or more than 300 mV below AGND. If an analog input pin is forced beyond these voltages, the current flowing through that pin should be limited to 25 mA or less to avoid permanent damage to the IC. The sum of all the over- drive currents into all pins must be less than 50 mA. When the input signal is expected to extend more than 300 mV be- yond the power supply limits for any reason (unknown/ uncontrollable input voltage range, power-on transients, fault conditions, etc.) some form of input protection, such as that shown in Figure 9, should be used. DS012811-30 FIGURE 7. Simplified ADC12762 Input Stage DS012811-31 FIGURE 8. Buffering the Input with an LM6361 High Speed Op Amp www.national.com 13 |
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