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Specifications subject to change without notice.

PHT-41470B

Electrical Specifications

-55°C

+25°C

+150°C

Symbol

Parameters and Test Conditions

Units

Min

Max

Min

Max Min Max

NFo

Optimum Noise Figure: VCE= 8 V, I

f =2.0 GHz

dB

1.9

G

A

Gain @ NFo: VCE = 8 V, I

f =2.0 GHz

dB

13.0

h

FE

I

CBO

I

EBO

Forward Current Transfer Ratio; V

Collector Cutoff Current; V

Emitter Cutoff Current; V

--

µA

µA

15

30

300

0.2

1.0

10

TMS UpScreen

Table 1A 100% Screening

Screening Test/Operation

MIL-STD-750

Method

Conditions

Temperature Cycling

1051

Condition C, Ta = -55°C to 175°C

20 cycles minimum

Constant Acceleration

2006

20,000G, Y1 axis only,

1 min. hold does not apply

High Temp. Reverse Bias

(HTRB)

1039

Condition A, t= 48 hrs., Ta = +150 °C

VCB= 80% of rated BVCBO

Interim Electrical Tests

------

+25°C; hFE, ICBO IEBO

Power Burn-in

1039

Condition B, t= 160 hrs., Ta = +25°C,

Tj = +150°C

Final Electrical Test

Group A, Subgroup 2

------

+25°C; hFE, ICBO IEBO

Delta Limits

------

∆hFE = ±25%

∆ICBO = ±50 nA or ±100%,

whichever is greater

Percent Defective Allowable

(PDA)

------

10% maximum applies to

Final Electrical and Deltas

Hermeticity - Fine Leak

- Gross Leak

1071

1071

Condition H1

Condition C or K

External Visual

2071

Group A Inspection

Subgroup1, Sample 22/0

Subgroup 3, Sample = 116/0

Subgroup 4, Sample = 116/0

Subgroup 5, 6 & 7 are not applicable

------

Subgroup 1, Visual Mechanical

Subgroup 3, hFE @ -55°C, ICBO @ +150°C

Subgroup 4, NFo & G

Marking - Dot units near pin 1

(blue) unless directed otherwise

Shipment Packaging

10 per strip

Marking: Manufacturer’s marking (if applicable) will remain on devices. TMS individual packaging will be

labeled with TMSPart Number and manufacturer date code. TMS shipment date code will appear on outer

label and C of C. Certificate of Conformance (C of C) will be sent with each shipment. This document provides

objective evidence of TMS testing and documents traceability to manufacturers wafer/lot identification.