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ESDA09 Datasheet(PDF) 2 Page - Shanghai Leiditech Electronic Technology Co., Ltd

Part # ESDA09
Description  Rated peak single pulse transient current Capacitance
PDF  5 Pages
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Manufacturer  LEIDITECH [Shanghai Leiditech Electronic Technology Co., Ltd]
Direct Link  http://www.leiditech.com
Logo LEIDITECH - Shanghai Leiditech Electronic Technology Co., Ltd

ESDA09 Datasheet(HTML) 2 Page - Shanghai Leiditech Electronic Technology Co., Ltd

  ESDA09 Datasheet HTML 1Page - Shanghai Leiditech Electronic Technology Co., Ltd ESDA09 Datasheet HTML 2Page - Shanghai Leiditech Electronic Technology Co., Ltd ESDA09 Datasheet HTML 3Page - Shanghai Leiditech Electronic Technology Co., Ltd ESDA09 Datasheet HTML 4Page - Shanghai Leiditech Electronic Technology Co., Ltd ESDA09 Datasheet HTML 5Page - Shanghai Leiditech Electronic Technology Co., Ltd  
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1-3 Reliability testing procedures
Reliability
parameter
Test
Test methods and remarks
Test requirement
Pulse current
capability
Imax
8/20 ㎲
IEC 1051-1, Test 4.5.
10 pulses in the same direction at 2
pulses per minute at maximum peak
current
d
Vn/Vn≤10%
no visible damage
Electrostatic
discharge
capability
ESD
C=150 pF,
R=330Ω
IEC 1000-4-2
Each
10
times
in
positive/negative
direction in 10 sec at 8KV contact
discharge (Level 4)
d
Vn/Vn≤10%
no visible damage
Environmenta
l reliability
Thermal shock
IEC 68-2-14
Condition for 1 cycle
Step 1 : Min.
–40℃, 30±3 min.
Step 2 : Ma x. +125℃, 30±3 min.
Number of cycles: 30 times
d
Vn/Vn≤5%
no visible damage
Low temperature
IEC 68-2-1
Place the chip at -40±5℃ for 1000±
12hrs. Remove and place for 24±2hrs at
room temp. condition, then measure
d
Vn/Vn≤5%
no visible damage
High temperature
IEC 68-2-2
Place the chip at 125±5℃ for 1000±
24hrs. Remove and place for 24±2hrs at
room temp. condition, then measure
d
Vn/Vn≤5%
no visible damage
Heat resistance
IEC 68-2-3
Apply the rated voltage for 1000±48hrs
at 85±3℃. Remove and place for 24±
2hrs
at room
temp. condition, then
measure
d
Vn/Vn≤5%
no visible damage
Humidity
resistance
IEC 68-2-30
Place the chip at 40±2℃ and 90 to 95%
humidity for 1000±24hrs. Remove and
place
for
24±2hrs
at
room
temp.
condition, then measure
d
Vn/Vn≤10%
no visible damage
Pressure cooker
test
Place the chip at 2 atm, 120℃, 85%RH
for 60 hrs. Remove and place for 24±
2hrs at room temp. condition, then
measure
d
Vn/Vn≤10%
no visible damage
Operating life
Apply the rated voltage for 1000±48hrs
at 125±3℃. Remove and place for 24±
2hrs at room temp. condition, then
measure
d
Vn/Vn≤10%
no visible damage
ESDA09
Rev :
www.leiditech.com
01.06.2015
2/5



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