MCP660T-ESLASHST datasheet(6/68 Pages) MICROCHIP

6 / 68 page

MCP660/1/2/3/4/5/9

DS20002194E-page 6

 2009-2014 Microchip Technology Inc.

1.3

Timing Diagram

FIGURE 1-1:

Timing Diagram.

1.4

Test Circuits

The circuit used for most DC and AC tests is shown in

Figure 1-2. This circuit can independently set VCM and

VOUT; see Equation 1-1. Note that VCM is not the

circuit’s common-mode voltage ((VP +VM)/2) and that

VOST includes VOS plus the effects (on the input offset

error, VOST) of temperature, CMRR, PSRR and AOL.

EQUATION 1-1:

FIGURE 1-2:

AC and DC Test Circuit for

Most Specifications.

VOUT

ISS

ICS

-1 µA

High Z

1µA

-6 mA

-1 µA

tON

tOFF

High Z

0nA

1µA

VIL

VIH

(typical)

Where:

GDM = Differential Mode Gain

(V/V)

VCM = Op Amp’s Common-Mode

Input Voltage

(V)

VOST = Op Amp’s Total Input

Offset Voltage

(mV)

-------

-----------

-------------------------

OST

IN-

IN+

–

OUT

-----------V

–

 V

OST 1GDM



VDD

VOUT

CB2

CB1

10 k



10 k



VDD/2

10 k



10 k



20 pF



2.2 µF

100 nF

VIN-

VIN+

6.8 pF

MCP66X

MCP660T-E/ST Datasheet(PDF) 6 Page - Microchip Technology

MCP660T-E/ST Datasheet(HTML) 6 Page - Microchip Technology

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68

Datasheet Download

Link URL