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STFU14N80K5 Datasheet(PDF) 3 Page - STMicroelectronics |
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STFU14N80K5 Datasheet(HTML) 3 Page - STMicroelectronics |
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3 / 12 page ![]() 2 Electrical characteristics TC = 25 °C unless otherwise specified. Table 4. On/off-state Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)DSS Drain-source breakdown voltage VGS = 0 V, ID = 1 mA 800 V IDSS Zero gate voltage drain current VGS = 0 V, VDS = 800 V 1 µA VGS = 0 V, VDS = 800 V TC = 125 °C(1) 50 µA IGSS Gate body leakage current VDS = 0 V, VGS = ±20 V ±10 µA VGS(th) Gate threshold voltage VDS = VGS, ID = 100 µA 3 4 5 V RDS(on) Static drain-source on- resistance VGS = 10 V, ID = 6 A 0.400 0.445 Ω 1. Defined by design, not subject to production test. Table 5. Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit Ciss Input capacitance VDS = 100 V, f = 1 MHz, VGS = 0 V - 620 - pF Coss Output capacitance - 60 - pF Crss Reverse transfer capacitance - 0.8 - pF Co(tr) (1) Equivalent capacitance time related VDS = 0 to 640 V, VGS = 0 V - 107 - pF Co(er) (2) Equivalent capacitance energy related - 39 - pF Rg Intrinsic gate resistance f = 1 MHz , ID= 0 A - 6.5 - Ω Qg Total gate charge VDD = 640 V, ID = 12 A VGS= 0 to 10 V (see Figure 15. Test circuit for gate charge behavior - 22 - nC Qgs Gate-source charge - 4.3 - nC Qgd Gate-drain charge - 16.5 - nC 1. Time related is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS 2. Energy related is defined as a constant equivalent capacitance giving the same stored energy as Coss when VDS increases from 0 to 80% VDSS Table 6. Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) Turn-on delay time VDD= 400 V, ID =6 A, RG = 4.7 Ω VGS = 10 V see ( Figure 14. Test circuit for resistive load switching times and Figure 19. Switching time waveform) - 12.5 - ns tr Rise time - 8 - ns td(off) Turn-off delay time - 33 - ns tf Fall time - 10 - ns STFU14N80K5 Electrical characteristics DS12888 - Rev 1 page 3/12 |
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