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AM29BDD160G Datasheet(PDF) 58 Page - Advanced Micro Devices |
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AM29BDD160G Datasheet(HTML) 58 Page - Advanced Micro Devices |
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58 / 79 page  56 Am29BDD160G June 7, 2006 TEST CONDITIONS Table 24. Test Specifications KEY TO SWITCHING WAVEFORMS SWITCHING WAVEFORMS Figure 12. Test Setup Note: Diodes are IN3064 or equivalent CL Device Under Test Test Condition 54D, 64C 65A Unit Output Load 1 TTL gate Output Load Capacitance, C L (including jig capacitance) 30 100 pF Input Rise and Fall Times 5ns Input Pulse Levels 0.0 V – V IO V Input timing measurement reference levels V IO/2 V Output timing measurement reference levels V IO/2 V KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) VIO VSS VIO/2 V VIO/2 V Output Measurement Level Input Figure 13. Input Waveforms and Measurement Levels |
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