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WLSIP-WL3D Datasheet(PDF) 1 Page - Amkor Technology |
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WLSIP-WL3D Datasheet(HTML) 1 Page - Amkor Technology |
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1 / 2 page ![]() Embedded Wafer Level System Integration Amkor Technology was among the first in the world to offer Wafer Level Fan- Out (WLFO) packaging, enabling a wide range of embedded heterogeneous system integration package solutions. These include: Wafer Level System-in- Package (WLSiP) a single or multiple die, with or without passives or sensors integration and 3D package stacking solutions (WL3D), including wafer level Package-on-Package (PoP) and face-to-face package assembly. Tailoring the best solutions requires a deep understanding of customer needs. Amkor’s package solutions are collaboratively developed, which often involves cooperation from the earliest stage of the chip-package-board co- design. Amkor is recognized for its proficiency in advanced packaging, and is known for a portfolio of innovative solutions manufactured in volume. These include the largest reliable WLCSP to date. By relying on an experienced in-house R&D team to design and develop innovative package and system solutions for a wide range of applications, we enable products from concept to market. As a leader in wafer-level packaging, Amkor offers world-class, turnkey solutions on state-of-the-art 300 mm wafer-processing equipment. In addition, we consistently deliver the best results in key metrics such as time to market, cost efficiency and yield. Reliability: Board Level Tests With a wide range of different WLSiP and WL3D package constructions and configurations possible, customer requirements are implemented in each product developed and reliability results are realized based on technical capabilities. WLSiP & WL3D DATA SHEET | WAFER LEVEL PRODUCTS Test Specification Criteria Lower Complexity WLSiP Temperature Cycling on Board (TCoB) IPC-9701 Condition TC3 -40°C/+125°C, 1 Cy/Hr 1000x Drop Test (DT) JEDEC JESD-22-B111 100 Drops Higher Complexity WL3D Temperature Cycling on Board (TCoB) IPC-9701 Condition TC3 -40°C/+125°C, 1 Cy/Hr 1000x Drop Test (DT) JEDEC JESD-22-B111 30 Drops Temperature Humidity Bias (THB) JEDEC JESD-22-A101 85°C/85% RH/Vcc, 1000 Hours ADVANCED PACKAGING SOLUTIONS f WLSiP side-by-side multi-chip modules f WLSiP with passives and leadless package integration f Portfolio of WLSiP configurations range from 2 x 3 mm2 (2 components) to 33 x 28 mm2 (10 components) f WL3D Package-on-Package (PoP) achieved by stacking WLSiP and other package types using Through Package Vias (TPV) f 3D integration realized by F2F assembly of flip chip to WLFO package APPLICATIONS f Mobile and consumer products, baseband, RF/wireless, analog, power management f ASIC, MEMS, sensors, system solutions for medical, security, encryption, DC/DC converter, radar and automotive f Electro-optical WLSiP, solutions for M2M communication and Internet of Things (IoT) f Extension of the technology platform to a wider field of application areas is ongoing |
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