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ADS5522IPAP Datasheet(PDF) 6 Page - Texas Instruments

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Part # ADS5522IPAP
Description  12-Bit, 80 MSPS Analog-To-Digital Converter
PDF  32 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

ADS5522IPAP Datasheet(HTML) 6 Page - Texas Instruments

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Input Clock
Analog
Input
Signal
Sample
N
N + 1
N + 2
N + 3
N + 4
N + 1 4
N + 1 6
N + 1 7
N + 1 5
N − 17
N − 16
N − 15
N − 14
N − 13
N − 3
N − 2
N − 1
N
tsu
th
tSTART
tA
tEND
tPDI
Data Out
(D0−D11)
17.5 Clock Cycles
Data Invalid
Output Clock
TIMING CHARACTERISTICS
(1)
ADS5522
SBAS320C – MAY 2004 – REVISED FEBRUARY 2007
NOTE: It is recommended that the loading at CLKOUT and all data lines are accurately matched to ensure that the above
timing matches closely with the specified values.
Figure 1. Timing Diagram
Typical values given at T
A = 25  C, min and max specified over the full recommeded operating temperature range,
AV
DD = DRVDD = 3.3 V, sampling rate = 80 MSPS, 50% clock duty cycle, 3-VPP differential clock, and CLOAD = 10 pF,
unless otherwise noted(2)
PARAMETER
DESCRIPTION
MIN
TYP
MAX
UNIT
Switching Specification
tA
Aperture delay
Input CLK falling edge to data sampling point
1
ns
Aperture jitter (uncertainty)
Uncertainty in sampling instant
300
fs
tSU
Data setup time
Data valid(3) to 50% of CLKOUT rising edge
3.6
4.7
ns
tH
Data hold time
50% of CLKOUT rising edge to data becoming
1.8
3.1
ns
invalid(3)
tSTART
Input clock to output data valid
Input clock rising edge to data valid start delay
3.3
5.0
ns
start(4)(5)
tEND
Input clock to output data valid
Input clock rising edge to data valid end delay
8.4
11.1
ns
end(4)(5)
tJIT
Output clock jitter
Uncertainty in CLKOUT rising edge, peak-to-peak
210
315
ps
tr
Output clock rise time
Rise time of CLKOUT measured from 20% to 80%
2.5
2.8
ns
of DRVDD
tf
Output clock fall time
Fall time of CLKOUT measured from 80% to 20%
2.1
2.3
ns
of DRVDD
tPDI
Input clock to output clock delay
Input clock rising edge zero crossing, to output
7.1
8
8.9
ns
clock rising edge 50%
tr
Data rise time
Data rise time measured from 20% to 80% of
5.6
6.1
ns
DRVDD
tf
Data fall time
Data fall time measured from 80% to 20% of
4.4
5.1
ns
DRVDD
Output enable(OE) to data output
Time required for outputs to have stable timings
1000
Clock
delay
with regard to input clock(6) after OE is activated
cycles
(1)
Timing parameters are ensured by design and characterization, and not tested in production.
(2)
See Table 5 through Table 6 in the Application Information section for timing information at additional sampling frequencies.
(3)
Data valid refers to 2 V for LOGIC HIGH and 0.8 V for LOGIC LOW.
(4)
See the Output Information section for details on using the input clock for data capture.
(5)
These specifications apply when the CLKOUT polarity is set to rising edge (according to Table 2). Add 1/2 clock period for the valid
number for a falling edge CLKOUT polarity.
(6)
Data outputs are available within a clock from assertion of OE; however, it takes 1000 clock cycles to ensure stable timing with respect
to input clock.
6
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