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ADC12062 Datasheet(PDF) 5 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # ADC12062
Description  12-Bit, 1 MHz, 75 mW A/D Converter
PDF  20 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

ADC12062 Datasheet(HTML) 5 Page - National Semiconductor (TI)

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Note 5
Human body model 100 pF discharged through a 15 kX resistor Machine model ESD rating is 200V
Note 6
See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices
Note 7
Typicals are at a25 C and represent most likely parametric norm
Note 8
Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)
Note 9
Integral Linearity Error is the maximum deviation from a straight line between the
measured offset and full scale endpoints
Note 10
Dynamic testing of the ADC12062 is done using the ADC IN input The input multiplexer adds harmonic distortion at high frequencies See the graph in the
Typical Performance Characteristics section for a typical graph of THD performance vs input frequency with and without the input multiplexer
Note 11
The signal-to-noise ratio is the ratio of the signal amplitude to the background noise level Harmonics of the input signal are not included in its calculation
Note 12
The contributions from the first nine harmonics are used in the calculation of the THD
Note 13
Effective Number of Bits (ENOB) is calculated from the measured signal-to-noise plus distortion ratio (SINAD) using the equation ENOB e (SINAD b
176)602
Note 14
The digital power supply current takes up to 10 seconds to decay to its final value after PD is pulled low This prohibits production testing of the standby
current Some parts may exhibit significantly higher standby currents than the 20 mA typical
Note 15
Power Supply Sensitivity is defined as the change in the Offset Error or the Full Scale Error due to a change in the supply voltage
TRI-STATE Test Circuit and Waveforms
TLH11490 – 2
TLH11490 – 3
TLH11490 – 4
TLH11490 – 5
5



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