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AS6C1016 Datasheet(PDF) 5 Page - Alliance Semiconductor Corporation |
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AS6C1016 Datasheet(HTML) 5 Page - Alliance Semiconductor Corporation |
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5 / 13 page ![]() AS6C1016 64K X 16 BIT LOW POWER CMOS SRAM Alliance Memory, Inc. Rev. 1.4 4 CAPACITANCE (TA = 25℃, f = 1.0MHz) PARAMETER SYMBOL MIN. MAX UNIT Input Capacitance CIN - 6 pF Input/Output Capacitance CI/O - 8 pF Note : These parameters are guaranteed by device characterization, but not production tested. AC TEST CONDITIONS Input Pulse Levels 0.2V to VCC - 0.2V Input Rise and Fall Times 3ns Input and Output Timing Reference Levels 1.5V Output Load CL = 30pF + 1TTL, IOH/IOL = -2mA/4mA AC ELECTRICAL CHARACTERISTICS (1) READ CYCLE PARAMETER SYM. AS6C1016-55 UNIT MIN. MAX. Read Cycle Time tRC 55 - ns Address Access Time tAA - 55 ns Chip Enable Access Time tACE - 55 ns Output Enable Access Time tOE - 30 ns Chip Enable to Output in Low-Z tCLZ* 10 - ns Output Enable to Output in Low-Z tOLZ* 5 - ns Chip Disable to Output in High-Z tCHZ* - 20 ns Output Disable to Output in High-Z tOHZ* - 20 ns Output Hold from Address Change tOH 10 - ns LB#, UB# Access Time tBA - 55 ns LB#, UB# to High-Z Output tBHZ* - 25 ns LB#, UB# to Low-Z Output tBLZ* 10 - ns (2) WRITE CYCLE PARAMETER SYM. AS6C1016-55 UNIT MIN. MAX. Write Cycle Time tWC 55 - ns Address Valid to End of Write tAW 50 - ns Chip Enable to End of Write tCW 50 - ns Address Set-up Time tAS 0 - ns Write Pulse Width tWP 45 - ns Write Recovery Time tWR 0 - ns Data to Write Time Overlap tDW 25 - ns Data Hold from End of Write Time tDH 0 - ns Output Active from End of Write tOW* 5 - ns Write to Output in High-Z tWHZ* - 20 ns LB#, UB# Valid to End of Write tBW 50 - ns *These parameters are guaranteed by device characterization, but not production tested. |
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