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MIC33M350 Datasheet(PDF) 7 Page - Microchip Technology |
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MIC33M350 Datasheet(HTML) 7 Page - Microchip Technology |
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7 / 32 page ![]() 2020-2021 Microchip Technology Inc. DS20006348B-page 7 MIC33M350 TON Control/Switching Frequency Switching ON Time TON —180 — ns VIN = 5V, VOUT = 1V Switching Frequency FREQ —1.2 — MHz VOUT = 1.0V, IOUT = 3A (Note 3) —1.1 — VOUT = 3.3V, IOUT = 3A Maximum Duty Cycle DCMAX — — 100 % Note 3 Short Circuit Protection High-Side MOSFET Forward Current Limit ILIM_HS 45 6.5 A Note 2 Low-Side MOSFET Forward Current Limit ILIM_LS —4.2 — A Note 2, Note 3 Low-Side MOSFET Negative Current Limit ILIM_NEG -2 -3 -4 A Note 2 N-Channel Zero-Crossing Threshold IZC_TH —0.9 — A Note 3 Current Limit Pulses Before Hiccup HICCUP — 8 — Cycles Note 3 Hiccup Period Before Restart — — 1 — ms Note 3 Internal MOSFETs High-Side On Resistance RDS-ON-HS —30 60 mΩ ISW =1A Low-Side On Resistance RDS-ON-LS —16 40 mΩ ISW =-1A Output Discharge Resistance RDS-ON-DSC —10 50 Ω VEN =0V, VSW = 5.5V, from VOUT to PGND SW Leakage Current ILEAK_SW —1 10 µA PVIN = 5.5V, VSW = 0V, VEN =0V, current flowing out of SW pin Power-Good (PG) Power Good Threshold PG_TH 87 91 95 %VOUT VOUT rising (good) Power Good Hysteresis PG_HYS — 4 — %VOUT VOUT falling (Note 3) Power Good Blanking Time PG_BLANK — 65 — µs Note 3 PG Output Leakage Current PG_LEAK — 30 300 nA VOUT =VOUT (NOM), VPG =5.5V Power Good Sink Low Voltage PG_SINKV — — 200 mV VOUT = 0V; IPG =10mA Thermal Shutdown Thermal Shutdown TSHDN —165 — °C TJ rising (Note 3) Thermal Shutdown Hysteresis TSHDN_HYST —22 — °C TJ falling (Note 3) Thermal Latch-Off Soft Start Cycles TH_LATCH — 4 — — Note 3 ELECTRICAL CHARACTERISTICS (1) (CONTINUED) Electrical Specifications: Unless otherwise specified, PVIN =5V; VOUT = 1.0V, COUT = 47 µF, TA = +25°C. Boldface values indicate -40°C TJ +125°C. Parameter Symbol Min. Typ. Max. Units Test Conditions Note 1: Specification for packaged product only. 2: Tested in open loop. The closed-loop current limit is affected by the inductance value. 3: Not production tested, data from bench characterization only |
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