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ISO808ATR Datasheet(PDF) 18 Page - STMicroelectronics |
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ISO808ATR Datasheet(HTML) 18 Page - STMicroelectronics |
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18 / 38 page ![]() Figure 12. Power GOOD pin behavior 6.7 Truth table Table 16. Truth table x = maintain the previous condition. Condition Status register BITx OUTx Fault register BITx FAULT PGOOD Normal operation 1 ON 0 H (not active) H (not active) 0 OFF 0 Thermal Junction (TJX> TJSD) 1 OFF 1 L (active) Don‘t care 0 OFF 1 H (not active) Thermal Case TC > TCSD See Figure 20 Don‘t care Don‘t care VCC UVLO FAULT (Figure 12) 0 OFF X X L (active) 1 POWER GOOD FAULT (Figure 12) 1 ON Don‘t care Don‘t care L (active) 0 OFF VDD UVLO (Watchdog) X OFF X H (not active) H (not active) SPI FAULT (module-8 violation) X X Don‘t care L (active) Don‘t care Internal communication error X X X L (active) Don‘t care 6.7.1 Junction over-temperature The thermal status of the device is updated during each transmission sequence between the two isolated stages. ISO808A, ISO808A-1 Truth table DS14170 - Rev 1 page 18/38 |
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