L9961 datasheet(23/65 Pages) STMICROELECTRONICS

23 / 65 page

Table 16. Die temperature monitor diagnostics

Fault type

Assertion condition

IC reaction to

assertion

Release condition

IC reaction to flag

clear

Maskable

DIE OT

If Die temperature

raises above TOT_TH,

the DIE_OT fault is

acknowledged

The DIE_OT flag is set

If Die temperature

falls below TOT_TH –

TOT_HYST, the DIE_OT

flag can be cleared by

MCU upon read

Charge FET is restored

to the status defined by

the CHG_ON bit

DIE_OT_PRDRV_MSK

masks reaction on

CHG/DCHG pins

Both charge and

discharge FETs are

turned OFF

The discharge FET

is restored to the

status defined by the

DCHG_ON bit

DIE_OT_BAL_MSK

masks reaction on

balancing

Balancing is interrupted

on all cells

Balancing FETs are

restored to the

status defined by

the corresponding

BAL<x>_ON bit

DIE_OT_FAULTN_MS

K masks reaction on

FAULTN pin

FAULTN line is

asserted

FAULTN line is

released

3.4.4.1

Electrical parameters

All parameters are tested and guaranteed in the following conditions, unless otherwise noted:

VB according to the operating range of Table 2; TJ according to the operating range of Table 5.

Table 17. Die temperature monitor electrical parameters

Symbol

Parameter

Min.

Typ.

Max.

Unit

Tj_ERR

Die temperature total conversion error

-10

°C

TOT_TH

Overtemperature threshold

150

°C

TOT_HYST

Overtemperature threshold hysteresis

°C

3.4.5

Diagnostics principle

The following example on Cell UV detection applies to all diagnostics featuring a programmable event counter.

The counter implements a symmetric hysteresis:

•

Each fault is asserted if the corresponding threshold is overcome. In such a case L9961 puts in place the

programmed reactions, based on the masking bits

•

Fault counter is saturated to the programmed threshold as long as fault is still present. During such an

interval, any attempt to clear the fault status is discarded. To avoid inadvertent fault detection, fault counter

threshold is saturated to 1 on the lower bound, meaning that at least one fault event must occur for fault

detection. Writing a ‘0’ to any I2C fault counter threshold will result in internal threshold being clamped to ‘1’

•

When fault is removed and event counter reaches zero, the fault flag can be cleared on write by MCU. In

such a case, system is brought back to functional state.

L9961

Voltage conversion routine

DS14012 - Rev 3

page 23/65

L9961 Datasheet(PDF) 23 Page - STMicroelectronics

L9961 Datasheet(HTML) 23 Page - STMicroelectronics

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65

Datasheet Download

Link URL