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AT89C5132-ROTIL Datasheet(PDF) 15 Page - ATMEL Corporation |
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AT89C5132-ROTIL Datasheet(HTML) 15 Page - ATMEL Corporation |
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15 / 38 page ![]() 19 AT89C5132 4173CS–USB–07/04 Notes: 1. Typical values are obtained using V DD= 3 V and TA= 25°C. They are not tested and there is no guarantee on these values. 2. Flash retention is guaranteed with the same formula for V DD min down to 0V. 3. See Table 154 for typical consumption in player mode. I DD, IDL and IPD Test Conditions Figure 1. I DD Test Condition, Active Mode I LI Input Leakage Current (P0, ALE, MCMD, MDAT, MCLK, SCLK, DCLK, DSEL, DOUT) 10 µA 0.45< V IN< VDD I TL Logical 1 to 0 Transition Current (P1, P2, P3, P4 and P5) -650 µA Vin = 2.0 V R RST Pull-Down Resistor 50 90 200 k Ω C IO Pin Capacitance 10 pF T A= 25°C V RET V DD Data Retention Limit 1.8 V I DD Operating Current (3) X1 / X2 mode 6.5 / 10.5 8 / 13.5 9.5 / 17 mA V DD < 3.3 V 12 MHz 16 MHz 20 MHz I DL Idle Mode Current (3) X1 / X2 mode 5.3 / 8.1 6.4 / 10.3 7.5 / 13 mA VDD < 3.3 V 12 MHz 16 MHz 20 MHz I PD Power-Down Mode Current 20 500 µAV RET < VDD < 3.3 V Table 1. Digital DC Characteristics V DD = 2.7 to 3.3V , TA = -40° to +85°C Symbol Parameter Min Typ (1) Max Units Test Conditions RST TST P0 All other pins are unconnected VDD VDD VDD I DD VDD PVDD UVDD AVDD X2 Clock Signal VSS X1 (NC) VSS PVSS UVSS AVSS |
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