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K6R1016C1D Datasheet(PDF) 7 Page - Samsung semiconductor |
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K6R1016C1D Datasheet(HTML) 7 Page - Samsung semiconductor |
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7 / 11 page ![]() K6R1016V1D CMOS SRAM Revision 3.0 - 7 - June 2002 for AT&T NOTES(READ CYCLE) 1. WE is high for read cycle. 2. All read cycle timing is referenced from the last valid address to the first transition address. 3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition and are not referenced to VOH or VOL levels. 4. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device. 5. Transition is measured ±200mV from steady state voltage with Load(B). This parameter is sampled and not 100% tested. 6. Device is continuously selected with CS=VIL. 7. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle. TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH) TIMING WAVEFORM OF WRITE CYCLE(1) (OE =Clock) Address CS UB, LB WE Data in Data out tWC tCW(3) tBW tWP(2) tAS(4) tDH tDW tOHZ(6) High-Z High-Z Valid Data OE tAW tWR(5) Valid Data High-Z tRC CS Address UB, LB OE Data out tHZ(3,4,5) tAA tCO tBA tOE tOLZ tLZ(4,5) tOHZ tBHZ(3,4,5) tBLZ(4,5) tPU tPD 50% 50% VCC Current ICC ISB tDH |
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