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M35B32 Datasheet(PDF) 34 Page - STMicroelectronics |
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M35B32 Datasheet(HTML) 34 Page - STMicroelectronics |
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34 / 44 page ![]() DC and AC parameters M35B32 34/44 DocID18391 Rev 4 Table 11. AC characteristics Test conditions specified in Table 6 and Table 8 Symbol Alt. Parameter Min. Max. Min. Max. Unit VCC = 2.5 to 5.5 V VCC = 4.5 to 5.5 V fC fSCK Clock frequency D.C. 10 D.C. 20 MHz tSLCH tCSS1 S active setup time 30 - 15 - ns tSHCH tCSS2 S not active setup time 30 - 15 - ns tSHSL tCS S deselect time 40 - 20 - ns tCHSH tCSH S active hold time 30 - 15 - ns tCHSL -S not active hold time 30 - 15 - ns tCH(1) tCLH Clock high time 40 - 20 - ns tCL(1) tCLL Clock low time 40 - 20 - ns tCLCH(2) tRC Clock rise time - 2 - 2 µs tCHCL(2) tFC Clock fall time - 2 - 2 µs tDVCH tDSU Data in setup time 10 - 5 - ns tCHDX tDH Data in hold time 10 - 10 - ns tSHQZ(2) tDIS Output disable time - 40 - 20 ns tCLQV(3) tV Clock low to output valid - 40 - 20 ns tCLQX tHO Output hold time 0 - 0 - ns tQLQH(2) tRO Output rise time - 40 - 20 ns tQHQL(2) tFO Output fall time - 40 - 20 ns tRLRH(2) tRST Reset pulse width 10 - 10 - µs tRHSL tREC Reset recovery time - 3 - 3 µs tSHRH - Chip should have been deselected before Reset is de-asserted 10 - 10 - ns tWHSL - Write Protect setup time 50 - 50 - ns tSHWL - Write Protect hold time 100 - 100 - ns tPW - Page Write cycle time - 5 - 5 ms tPP - Page Program cycle time - 5 - 5 ms tFP - Fast Page Program cycle time (when addressing the Event sector) -1 - 1 ms tPE - Page Erase cycle time - 5 - 5 ms tSE - Sector Erase cycle time - 5 - 5 ms tW - Write to Status Register cycle time - 5 - 5 ms 1. tCH + tCL must never be lower than the shortest possible clock period, 1/fC(max). 2. Value guaranteed by characterization, not 100% tested in production. 3. tCLQV must be compatible with tCL (clock low time): if the SPI bus master offers a Read setup time tSU = 0 ns, tCL can be equal to (or greater than) tCLQV; in all other cases, tCL must be equal to (or greater than) tCLQV+tSU. |
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