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LTC2439-1IGN Datasheet(PDF) 23 Page - Linear Technology |
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LTC2439-1IGN Datasheet(HTML) 23 Page - Linear Technology |
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23 / 28 page ![]() LTC2439-1 23 24391f and each ohm of source resistance driving IN+ or IN– will result in 1.11 • 10–7 • fEOSCLSB gain error at full scale. The effect of the source resistance on the two input pins is additive with respect to this gain error. The typical +FS and –FS errors as a function of the sum of the source resis- tance seen by IN+ and IN– for large values of CIN are shown in Figures 16 and 17. In addition to this gain error, an offset error term may also appear. The offset error is proportional with the mismatch between the source impedance driving the two input pins IN+ and IN– and with the difference between the input and reference common mode voltages. While the input drive circuit nonzero source impedance combined with the con- verter average input current will not degrade the INL performance, indirect distortion may result from the modu- lation of the offset error by the common mode component of the input signal. Thus, when using large CIN capacitor values, it is advisable to carefully match the source imped- ance seen by the IN+ and IN– pins. When FO = LOW (internal oscillator and 50Hz/60Hz notch), every 60 Ω mis- match in source impedance transforms a full-scale com- mon mode input signal into a differential mode input signal of 1LSB. When FO is driven by an external oscillator with a frequency fEOSC, every 1Ω mismatch in source impedance transforms a full-scale common mode input signal into a differential mode input signal of 1.11 • 10–7 • fEOSCLSB. Figure 18 shows the typical offset error due to input common mode voltage for various values of source resistance imbalance between the IN+ and IN– pins when large CIN values are used. If possible, it is desirable to operate with the input signal common mode voltage very close to the reference signal common mode voltage as is the case in the ratiometric measurement of a symmetric bridge. This configuration eliminates the offset error caused by mismatched source impedances. The magnitude of the dynamic input current depends upon the size of the very stable internal sampling capacitors and upon the accuracy of the converter sampling clock. The accuracy of the internal clock over the entire temperature and power supply range is typically better than 0.5%. Such a specification can also be easily achieved by an external clock. When relatively stable resistors (50ppm/ °C) are used for the external source impedance seen by IN+ and RSOURCE (Ω) 0 100 200 300 400 500 600 700 800 900 1000 24361 F16 20 16 12 8 4 0 VCC = 5V REF+ = 5V REF – = GND IN+ = 3.75V IN– = 1.25V FO = GND TA = 25°C CIN = 0.01µF CIN = 0.1µF CIN = 1µF, 10µF RSOURCE (Ω) 0 100 200 300 400 500 600 700 800 900 1000 24361 F17 0 –4 –8 –12 –16 –20 VCC = 5V REF+ = 5V REF – = GND IN+ = 1.25V IN– = 3.75V FO = GND TA = 25°C CIN = 0.01µF CIN = 0.1µF CIN = 1µF, 10µF VINCM (V) 0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 24361 F18 8 4 0 –4 –8 FO = GND TA = 25°C RSOURCEIN– = 500Ω CIN = 10µF VCC = 5V REF+ = 5V REF – = GND IN+ = IN– = VINCM A: ∆RIN = +400Ω B: ∆RIN = +200Ω C: ∆RIN = +100Ω D: ∆RIN = 0Ω E: ∆RIN = –100Ω F: ∆RIN = –200Ω G: ∆RIN = –400Ω A B C D E F G Figure 16. +FS Error vs RSOURCE at IN+ or IN– (Large CIN) Figure 17. –FS Error vs RSOURCE at IN+ or IN– (Large CIN) Figure 18. Offset Error vs Common Mode Voltage (VINCM = IN+ = IN–) and Input Source Resistance Imbalance ( ∆RIN = RSOURCEIN+ – RSOURCEIN–) for Large CIN Values (CIN ≥ 1µF) APPLICATIO S I FOR ATIO |
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