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STM32L010K8 Datasheet(PDF) 43 Page - STMicroelectronics |
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STM32L010K8 Datasheet(HTML) 43 Page - STMicroelectronics |
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43 / 92 page ![]() DS12325 Rev 3 43/92 STM32L010K8 STM32L010R8 Electrical characteristics 82 6.3.4 Supply current characteristics The current consumption is a function of several parameters and factors such as the operating voltage, temperature, I/O pin loading, device software configuration, operating frequencies, I/O pin switching rate, program location in memory and executed binary code. The current consumption is measured as described in Figure 8: Current consumption measurement scheme. All Run-mode current consumption measurements given in this section are performed with a reduced code that gives a consumption equivalent to Dhrystone 2.1 code if not specified otherwise. The current consumption values are derived from the tests performed under ambient temperature and VDD supply voltage conditions summarized in Table 15: General operating conditions unless otherwise specified. VDDCoeff(4) Voltage coefficient 3.0 V < VDDA < 3.6 V - - 2000 ppm/V TS_vrefint(4)(5) ADC sampling time when reading the internal reference voltage -5 10 - µs TADC_BUF(4) Startup time of reference voltage buffer for ADC -- - 10 µs IBUF_ADC(4) Consumption of reference voltage buffer for ADC - - 13.5 25 µA IVREF_OUT(4) VREF_OUT output current(6) -- - 1 µA CVREF_OUT(4) VREF_OUT output load - - - 50 pF ILPBUF(4) Consumption of reference voltage buffer for VREF_OUT - - 730 1200 nA VREFINT_DIV1(4) 1/4 reference voltage - 24 25 26 % VREFINT VREFINT_DIV2(4) 1/2 reference voltage - 49 50 51 VREFINT_DIV3(4) 3/4 reference voltage - 74 75 76 1. Refer to Table 30: Peripheral current consumption in Stop and Standby mode for the value of the internal reference current consumption (IREFINT). 2. Guaranteed by test in production. 3. The internal VREF value is individually measured in production and stored in dedicated EEPROM bytes. 4. Guaranteed by design, not tested in production. 5. Shortest sampling time can be determined in the application by multiple iterations. 6. To guarantee less than 1% VREF_OUT deviation. Table 18. Embedded internal reference voltage(1) (continued) Symbol Parameter Conditions Min Typ Max Unit |
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