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MCP662-E/MF Datasheet(PDF) 5 Page - Microchip Technology |
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MCP662-E/MF Datasheet(HTML) 5 Page - Microchip Technology |
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5 / 42 page ![]() © 2009 Microchip Technology Inc. DS22194A-page 5 MCP661/2/3/5 1.3 Timing Diagram FIGURE 1-1: Timing Diagram. 1.4 Test Circuits The circuit used for most DC and AC tests is shown in Figure 1-2. This circuit can independently set VCM and VOUT; see Equation 1-1. Note that VCM is not the circuit’s common mode voltage ((VP +VM)/2), and that VOST includes VOS plus the effects (on the input offset error, VOST) of temperature, CMRR, PSRR and AOL. EQUATION 1-1: FIGURE 1-2: AC and DC Test Circuit for Most Specifications. TABLE 1-4: TEMPERATURE SPECIFICATIONS Electrical Characteristics: Unless otherwise indicated, all limits are specified for: VDD = +2.5V to +5.5V, VSS = GND. Parameters Sym Min Typ Max Units Conditions Temperature Ranges Specified Temperature Range TA -40 — +125 °C Operating Temperature Range TA -40 — +125 °C (Note 1) Storage Temperature Range TA -65 — +150 °C Thermal Package Resistances Thermal Resistance, 8L-3x3 DFN θJA —60 — °C/W (Note 2) Thermal Resistance, 8L-SOIC θJA — 149.5 — °C/W Thermal Resistance, 10L-3x3 DFN θJA —57 — °C/W (Note 2) Thermal Resistance, 10L-MSOP θJA — 202 — °C/W Note 1: Operation must not cause TJ to exceed Maximum Junction Temperature specification (150°C). 2: Measured on a standard JC51-7, four layer printed circuit board with ground plane and vias. VOUT ISS ICS -1 µA High-Z 1µA On -6 mA -1 µA tON tOFF High-Z 0nA 1µA CS VIL VIH (typical) (typical) (typical) (typical) (typical) (typical) G DM R F RG ⁄ = V CM V P V DD 2 ⁄ + () 2 ⁄ = V OUT V DD 2 ⁄ () V P V M – () V OST 1GDM + () ++ = Where: GDM = Differential Mode Gain (V/V) VCM = Op Amp’s Common Mode Input Voltage (V) VOST = Op Amp’s Total Input Offset Voltage (mV) V OST V IN– V IN+ – = VDD RG RF VOUT VM CB2 CL RL VL CB1 10 k Ω 10 k Ω RG RF VDD/2 VP 10 k Ω 10 k Ω 20 pF 1k Ω 2.2 µF 100 nF VIN– VIN+ CF 6.8 pF CF 6.8 pF MCP66X |
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