IMX28CEC datasheet(12/70 Pages) FREESCALE

12 / 70 page

i.MX28 Applications Processors Data Sheet for Consumer Products, Rev. 1

Freescale Semiconductor

Table 7 shows the electrostatic discharge immunity.

Note that HBM and CDM pass ESD testing per AEC-Q100.

Analog Supply Voltage

VDDA

–0.3

2.10

Digital Core Supply Voltage

VDDD

–0.3

1.575

Non-EMI Digital I/O Supply

VDDIO

–0.3

3.63

EMI Digital I/O Supply

VDDIO.EMI

–0.3

3.63

DC-DC Converter2

DCDC_BATT

–0.3

BATT

Input Voltage on Any Digital I/O Pin Relative to Ground

—

–0.3

VDDIO+0.3

Input Voltage on USB_DP and USB_DN Pins Relative to Ground3

—–0.3

3.63

Analog I/O absolute maximum ratings (exceptions: XTALI, XTALO,

RTC_XTALI, RTC_XTALO)

—

–0.3

VDDIO+0.3

Storage Temperature

—

–40

125

°C

1 VDDIO can be applied to PSWITCH through a 10 k

Ω resistor. This is necessary in order to enter the chip’s firmware recovery

mode. (The on-chip circuitry prevents the actual voltage on the pin from exceeding acceptable levels.)

2 Application should include a Schottky diode between BATT and VDD4P2.

3 USB_DN and USB_DP can tolerate 5V for up to 24 hours. Note that while 5V is applied to USB_DN or USB_DP, LRADC

readings can be corrupted.

Table 7. Electrostatic Discharge Immunity

289-Pin BGA Package

Tested Level

Human Body Model (HBM)

2 kV

Charge Device Model (CDM)

500 V

Table 6. DC Absolute Maximum Ratings (continued)

Parameter

Symbol

Min.

Max.

Units

IMX28CEC Datasheet(PDF) 12 Page - Freescale Semiconductor, Inc

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